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Advanced detection in Lorentz microscopy: pixelated detection in differential phase contrast scanning transmission electron microscopy

机译:Lorentz显微镜中的高级检测:差相对比扫描透射电子显微镜中的像素化检测

摘要

Modern devices require fundamental length scales to be analysed in a maximum detail to enable research of new types of phenomena and design new materials. In this thesis, an advancement in Lorentz microscopy will be presented where the focus was placed not only onto resolution in spatial space but also onto resolution in reciprocal space. This allows greater sensitivity to measurements of the integrated magnetic induction within thin samples. This was achieved by a novel approach to the data acquisition, where instead of a segmented (annular) detector, a pixelated detector was used to measure the deflection of the scanning transmission microscopy (STEM) probe due to the in-plane integrated magnetic induction.udududComputer vision algorithms were researched to find an efficient, noise-robust way to register the deflection of the STEM probe. This enabled a novel approach to data analysis, where a scatter of the 2D integrated induction (a bivariate histogram) is used to show the distribution of the magnetic induction vector. The experimental results are supported by simulations, where a model of a thin polycrystalline sample causes a shift of the simulated beam due to phase modulations. The results of the detection in both the simulation and experiment showed that cross-correlation based processing can efficiently separate the low spatial frequencies (from the in-plane magnetic induction), and high spatial frequencies (from the structure of the polycrystalline sample). udududThis work will enable quantitative analysis of a greater number of thin magnetic samples, for which the current methods are hampered by the diffraction contrast. This will be particularly helpful for the study low moment, out of plane, magnetised thin films. Currently such systems are of great interest due to the tunability of their magnetic properties and the novel magnetic structures present within them. This work also provides an important step for computational methods in transmission electron microscopy, as this is one of the first examples of 4D data acquisition of processing in STEM (where two dimensions represent the spatial scanning dimensions and other two the reciprocal space).udududImaging methods developed in this thesis were applied to the topic of skyrmions in a thin layer of a FeGe cubic helimagnet, where the very fine detail of the structure of their in-plane integrated magnetic induction was shown to contain a distorted modulations of its profile. This was compared to a simple three harmonic frequency model, which was altered to fit some characteristics of the imaged magnetic skyrmions.udududIn this work, for the first time, a direct comparison of differential phase contrast and electron holography will be shown for a simple experiment in which the integrated electric field between two needles was measured in free space in the same microscope. Although it was concluded that both methods are equivalent, some small discrepancies of measured values were present due to a long range electric field in electron holography and/or drift of the beam in between scans in STEM.
机译:现代设备要求对基本长度标度进行最大程度的详细分析,以便能够研究新型现象并设计新材料。在本文中,将介绍Lorentz显微镜技术的进步,该技术不仅将重点放在空间空间的分辨率上,而且还将重点放在互易空间的分辨率上。这使得对稀薄样品中的积分磁感应的测量具有更高的灵敏度。这是通过一种新颖的数据采集方法来实现的,其中使用像素化检测器代替分段(环形)检测器来测量由于平面内集成磁感应而导致的扫描透射显微镜(STEM)探头的偏转。对计算机视觉算法进行了研究,以找到一种有效的,抗噪声的方法来记录STEM探针的偏转。这实现了一种新颖的数据分析方法,其中使用了二维积分感应的散布(双变量直方图)来显示磁感应矢量的分布。模拟结果支持了实验结果,其中,薄的多晶样品模型会由于相位调制而导致模拟光束发生偏移。在仿真和实验中的检测结果均表明,基于互相关的处理可以有效地将低空间频率(来自面内磁感应)和高空间频率(与多晶样品的结构)分开。 ud ud ud这项工作将能够对大量薄磁性样品进行定量分析,而目前的方法受到衍射对比度的影响。这对于研究平面外低磁化磁化薄膜特别有用。当前,由于这样的系统的磁性能的可调谐性和其中存在的新颖的磁结构,因此引起了极大的兴趣。这项工作还为透射电子显微镜中的计算方法提供了重要的一步,因为这是STEM中处理过程的4D数据采集的第一个示例之一(其中两个维表示空间扫描维,另外两个维表示倒数空间)。本论文中开发的成像方法应用于FeGe立方螺旋磁铁薄层中的天体离子,其中平面内集成磁感应的结构的非常细微的细节显示出包含一个畸变的调制。它的个人资料。将此与简单的三谐波频率模型进行了比较,该模型已进行了更改,以适应成像的磁性天体的某些特征。 ud ud ud在这项工作中,首次将直接比较微分相衬度和电子全息图。图中显示了一个简单的实验,其中在同一显微镜下的自由空间中测量了两个针之间的积分电场。尽管得出的结论是这两种方法是等效的,但由于电子全息术中的长距离电场和/或STEM中两次扫描之间的电子束漂移,因此存在一些小的测量值差异。

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    Krajnak Matus;

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  • 年度 2017
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