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Mapping the performance of PV modules, effects of module type and data averaging

机译:绘制光伏组件的性能,组件类型的影响和数据平均

摘要

A method is presented for estimating the energy yield of photovoltaic (PV) modules at arbitrary locations in a large geographical area.The method applies a mathematical model for the energy performance of PV modules as a function of in-plane irradiance and moduletemperature and combines this with solar irradiation estimates from satellite data and ambient temperature values from ground stationmeasurements. The method is applied to three different PV technologies: crystalline silicon, CuInSe2 and CdTe based thin-film technologyin order to map their performance in fixed installations across most of Europe and to identify and quantify regional performancefactors. It is found that there is a clear technology dependence of the geographical variation in PV performance. It is also shown thatusing long-term average values of irradiance and temperature leads to a systematic positive bias in the results of up to 3%. It is suggested to use joint probability density functions of temperature and irradiance to overcome this bias.
机译:提出了一种用于估计大地理区域中任意位置的光伏(PV)组件能量产出的方法,该方法将数学模型应用于PV组件的能量性能,作为面内辐照度和组件温度的函数,并将其结合起来可以根据卫星数据估算出太阳辐射,并根据地面站测量得到的环境温度值。该方法应用于三种不同的PV技术:基于晶体硅,CuInSe2和CdTe的薄膜技术,以便绘制出欧洲大部分地区在固定安装中的性能,并确定和量化区域性能因素。发现PV性能的地理变化与技术有着明显的相关性。还显示使用辐照度和温度的长期平均值会导致系统的正偏差,结果最高可达3%。建议使用温度和辐照度的联合概率密度函数来克服此偏差。

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