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Hydroxyl Defect Effect on Reoxidation of Sc-Doped (Ba,Ca)(Ti,Zr)O 3 Fired in Reducing Atmospheres

机译:羟基缺陷对在还原气氛中烧制掺Sc(Ba,Ca)(Ti,Zr)O 3的再氧化的影响

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摘要

The behavior of grain and grain-boundary conductivity of acceptor (Sc)-doped (Ba,Ca)(Ti,Zr)O3 ceramics sintered in moist reducing atmosphere and subsequently reoxidized in dry and moist atmosphere was investigated by means of impedance spectroscopy (IS). In moist firing atmosphere, water vapor was found to react with oxygen vacancies, forming positively charged hydroxyl defects inline image on regular oxygen sites in the crystal lattice. Proton hopping is considered to raise the ionic conductivity significantly. Therefore, hydroxyl defects inline image in turn influence the grain conduction. Hydroxyl defects inline image are also considered to be responsible for alternations of the dielectric maximum at the Curie point.
机译:通过阻抗光谱法(IS)研究了掺杂受主(Sc)的(Ba,Ca)(Ti,Zr)O3陶瓷在还原性气氛中烧结并随后在干燥和潮湿的环境中再氧化的行为以及晶界电导行为。 )。在潮湿的烧成气氛中,发现水蒸气与氧空位反应,在晶格中规则的氧位线上形成带正电的羟基缺陷。质子跳跃被认为可显着提高离子电导率。因此,羟基缺陷在线图像继而影响晶粒导电。羟基缺陷在线图像也被认为是居里点电介质最大值变化的原因。

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