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Radiation hardness tests on electronic components for CBM/STS low voltage power supply

机译：CBM / STS低压电源电子元件的辐射硬度测试

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Löchner S.; Koczon P.; Rost A.;
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年度 2015
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1. Cyclic Characteristics of the Physical Properties of Key Strata in CBM Systems Controlled by Sequence Stratigraphy——An Example from the Gujiao Block [J] . WANG Gang, QIN Yong, XIE Yiwei, 地质学报（英文版） . 2020,第002期
2. A Neutron Testing Facility to Study the Radiation Hardness of the Electronic Components at the SC-1000 Synchrocyclotron of National Research Center Kurchatov Institute-Petersburg Nuclear Physics Institute [J] . Physics of atomic nuclei . 2019,第12期

机译：学习国立研究中心Kurchatov Institute-Petersburg核物理研究所的SC-1000同步循环电子元件辐射硬度的中子试验设施
3. A new sustain driver with energy recovery circuit based on low-voltage components and low-voltage power supply for AC plasma display panel [J] . Sangshin Kwak, Jin-Woo Jung, Dong-Myung Lee, IEEE Transactions on Consumer Electronics . 2008,第3期

机译：一种新型的维持驱动器，其具有基于低压组件和低压电源的能量回收电路，用于交流等离子显示面板
4. Generate Those Low Voltages Needed For FPGA-Based Boards: it's now common for FPGA-based boards to require as many as four or five different low-voltage supplies to power the various components [J] . John Krehbiel, Ross Staffhorst Electronic Design . 2004,第26期

机译：生成基于FPGA的板所需的低压：基于FPGA的板现在通常需要多达四个或五个不同的低压电源来为各种组件供电
5. Evaluating the switching mode power supplies used in radiation hardness tests of integrated circuits [C] . V. M. Placinta, L. N. Cojocariu, C. Ravariu International Semiconductor Conference . 2017

机译：评估集成电路辐射硬度测试中使用的开关电源
6. Structural bifurcation tests for voltage collapse and low-frequency oscillation in multimachine power systems. [D] . Guo, Tzong-Yih. 1992

机译：多机电源系统中电压崩溃和低频振荡的结构分叉测试。
7. A High Resolution On-Chip Delay Sensor with Low Supply-Voltage Sensitivity for High-Performance Electronic Systems [O] . Duo Sheng, Hsiu-Fan Lai, Sheng-Min Chan, 2015

机译：具有低电源电压灵敏度的高分辨率片上延迟传感器用于高性能电子系统
8. Monitorig system for radiation hardness tests of electronic components for future FAIR experiments [O] . Löchner S., Koczon P. 2015

机译：电子元件辐射硬度测试的监控系统，用于将来的FAIR实验
9. Operating manual for the dynamic Test Set (DTS) for the Low Voltage Power Supply Part of the AN/ALQ-119(V) Electronic Countermeasures System [R] . White, J. R. 1979

机译：aN / aLQ-119（V）电子对抗系统低压电源部分动态测试装置（DTs）操作手册

Radiation hardness tests on electronic components for CBM/STS low voltage power supply

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