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In situ Sr isotope measurement of small glass samples using multiple-Faraday collector inductively coupled plasma mass spectrometry with 10^12Ω resistor high gain Faraday amplifiers

机译:使用10 ^12Ω电阻器高增益法拉第放大器的多法拉第收集器电感耦合等离子体质谱法对小玻璃样品进行原位Sr同位素测量

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摘要

An analytical protocol was developed for correcting Kr baseline-induced bias and Rb isobaric overlap factors to analyse Sr isotope ratios for small glass samples using excimer laser ablation (LA) with an Aridus II desolvating nebuliser dual-intake system and multiple collector inductively coupled plasma mass spectrometry (MC-ICP-MS). The combined use of a low-oxide interface setup, along with high-gain Faraday amplifiers with a 1012 Ω resistor, enabled precise determination of Sr isotope ratios from 50-100 μm diameter craters at 10 Hz laser repetition rate. Residual analytical biases of 84Sr/86Sr and 87Sr/86Sr isotope ratios, obtained from Kr baseline suppressions (Kimura et al., 2013, Journal of Analytical Atomic Spectrometry, 28, 945-957), were found to be nonlinear, but the correction method was applicable to 50-200 μm/10 Hz craters. We also found that the 85Rb/87Rb overlap correction factor changed with time with a change in the surface condition of the sampler-skimmer cones. The correction factor of 85Rb/87Rb was thus determined at least once per five unknown measurements using the Aridus solution intake line. We determined 87Sr/86Sr isotope ratios from MkAn anorthite (Sr = 305 ppm, Rb = 0.07 ppm), BHVO-2G, KL2-G, ML3B-G (Sr = 312-396 ppm, Rb = 5.8-9.2 ppm), and BCR-2G (Sr = 337 ppm, Rb = 48.5 ppm) basalt glasses using a 50-100 μm/10 Hz crater. The results agree well with their reference values, determined by thermal ionisation mass spectrometry, even with the high Rb/Sr ratio (0.14) in the BCR-2G glass. The internal/intermediate precisions were ±0.0002 (two-standard deviation: 2SD) for 100 μm craters and ±0.0005 for 50 μm craters. The new instrument settings and analytical protocol improved the precision by a factor of two compared to the previous report using LA-(sector field)-ICP-MS and enables the analysis of sample volumes that are ten times smaller than those used in previous LA-MC-ICP-MS analyses with equal precision.
机译:开发了一种用于校正Kr基线引起的偏差和Rb等压重合因子的分析协议,以使用准分子激光烧蚀(LA)和Aridus II脱溶剂雾化器双进气系统和多收集器电感耦合等离子体质量分析小玻璃样品的Sr同位素比光谱法(MC-ICP-MS)。低氧化物界面设置与具有1012Ω电阻的高增益法拉第放大器的组合使用,能够以10 Hz的激光重复频率精确确定50-100μm直径环形山的Sr同位素比。发现从Kr基线抑制获得的84Sr / 86Sr和87Sr / 86Sr同位素比率的残留分析偏差(Kimura等人,2013,Journal of Anatotical Atomic Spectrometry,28,945-957)是非线性的,但采用校正方法适用于50-200μm/ 10 Hz环形山。我们还发现85Rb / 87Rb重叠校正因子随采样器撇渣锥的表面状况的变化而变化。因此,使用Aridus溶液吸入管线每五次未知测量中至少确定一次校正因子85Rb / 87Rb。我们确定了MkAn钙长石(Sr = 305 ppm,Rb = 0.07 ppm),BHVO-2G,KL2-G,ML3B-G(Sr = 312-396 ppm,Rb = 5.8-9.2 ppm)的87Sr / 86Sr同位素比率使用50-100μm/ 10 Hz陨石坑的BCR-2G(Sr = 337 ppm,Rb = 48.5 ppm)玄武岩玻璃。即使在BCR-2G玻璃中具有高Rb / Sr比(0.14),结果也与通过热电离质谱法测定的参考值非常吻合。 100微米环形山的内部/中间精度为±0.0002(两个标准偏差:2SD),而50微米环形山的内部/中间精度为±0.0005。与使用LA-(扇区字段)-ICP-MS的先前报告相比,新的仪器设置和分析协议将精度提高了两倍,并使分析的样品量比先前LA-使用的体积小十倍。 MC-ICP-MS的分析精度相同。

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