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Energy band bowing parameter in AlxGa1-xN alloys

机译:AlxGa1-xN合金的能带弯曲参数

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摘要

Molecular-beam epitaxy grown AlxGa1−xN alloys covering the entire range of alloy compositions, 0⩽x⩽1, have been used to determine the alloy band gap dependence on its composition. The Alchemical composition was deduced from secondary ion mass spectroscopy and Rutherford backscattering. The composition was also inferred from x-ray diffraction. The band gap of the alloy was extracted from low temperature optical reflectance measurements which are relatively more accurate than photoluminescence. Fitting of the band gap data resulted in a bowing parameter of b=1.0 eV over the entire composition range. The improved accuracy of the composition and band gap determination and the largest range of the Al composition over which our study has been conducted increase our confidence in this bowing parameter.
机译:分子束外延生长的AlxGa1-xN合金覆盖了合金成分的整个范围(0⩽x⩽1),已被用来确定合金带隙对其成分的依赖性。炼金术的成分是由二次离子质谱和卢瑟福反向散射推论得出的。还从X射线衍射推断出组成。合金的带隙是从低温光反射率测量中提取的,该测量值比光致发光相对更准确。带隙数据的拟合导致整个组成范围内的弯曲参数b = 1.0 eV。进行了我们的研究之后,提高了成分的精确度和带隙确定以及最大范围的Al成分,增加了我们对该弯曲参数的信心。

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