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Thin film/substrate systems featuring arbitrary film thickness and misfit strain distributions. Part II: Experimental validation of the non-local stress/curvature relations

机译：具有任意膜厚和失配应变分布的薄膜/基板系统。第二部分：非局部应力/曲率关系的实验验证

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Brown M.A.; Rosakis A.J.; Feng X.; Huang Y.; Üstündag Ersan;
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年度 2007
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1. Thin film substrate systems featuring arbitrary film thickness and misfit strain distributions. Part II: Experimental validation of the non-local stress curvature relations [J] . Brown MA, Rosakis AJ, Feng X, International Journal of Solids and Structures . 2007,第6期

机译：具有任意膜厚度和失配应变分布的薄膜基板系统。第二部分：非局部应力曲率关系的实验验证
2. Thin film/substrate systems featuring arbitrary film thickness and misfit strain distributions. Part I: Analysis for obtaining film stress from non-local curvature information [J] . Ngo D, Feng X, Huang Y, International Journal of Solids and Structures . 2007,第6期

机译：具有任意膜厚和失配应变分布的薄膜/基板系统。第一部分：从非局部曲率信息获得膜应力的分析
3. Non-uniform, axisymmetric misfit strain: in thin films bonded on plate substrates/substrate systems: the relation between non-uniform film stresses and system curvatures [J] . Yonggang Huang, D. Ngo, A.J. Rosakis 力学学报：英文版 . 2005,第004期

机译：非均匀的轴对称失配应变：在粘结在平板基板/基板系统上的薄膜中：非均匀薄膜应力与系统曲率之间的关系
4. Phase diagrams and in-plane anisotropic misfit strains of (110) Ba_(0.6)Sr_(0.4)TiO_3 thin films grown on (001) orthorhombic NdGaO_3 substrate [C] . P. F. Liu, X. J. Meng, J. L. Sun, International Conference on Thin Film Physics and Applications . 2008

机译：（110）Ba_（0.6）Sr_（0.4）TiO_3薄膜在（001）正交Ndgao_3衬底上生长的相图和面内各向异性菌株
5. An analysis of non-uniform stress states in finite thin film/substrate system: The need of full-field curvature measurements. [D] . Ngo, Duc Minh. 2009

机译：有限薄膜/基板系统中非均匀应力状态的分析：需要全场曲率测量。
6. Misfit Strain Relaxation of Ferroelectric PbTiO3/LaAlO3 (111) Thin Film System [O] . Y. B. Xu, Y. L. Tang, Y. L. Zhu, -1

机译：铁电PbTiO3 / LaAlO3（111）薄膜系统的应变失配松弛
7. Thin film/substrate systems featuring arbitrary film thickness and misfit strain distributions. Part I: Analysis for obtaining film stress from non-local curvature information [O] . Ngo D., Feng X., Huang Y., 2007

机译：具有任意膜厚和失配应变分布的薄膜/基板系统。第一部分：从非局部曲率信息获得膜应力的分析

Thin film/substrate systems featuring arbitrary film thickness and misfit strain distributions. Part II: Experimental validation of the non-local stress/curvature relations

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