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Atomic Force Microscopy as a Valuable Tool in an Innovative Multi-scale and Multi-technique Non-invasive Approach to Surface Cleaning Monitoring

机译：原子力显微镜是一种创新的多尺度，多技术，非侵入性的表面清洁监测方法中的宝贵工具

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Pereira C.; Ferreira I.M.P.L.V.O.; Branco L.C.; Sandu I.C.A.; Busani T.;
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年度 2013
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2. Characterization of Gd loaded chitosan-TPP nanohydrogels by a multi-technique approach combining dynamic light scattering (DLS), asymetrical flow-field-flow-fractionation (AF4) and atomic force microscopy (AFM) and design of positive contrast agents for molecular resonance imaging (MRI) [J] . Rigaux G., Gheran C. V., Callewaert M., Nanotechnology . 2017,第5期

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3. A Preparation Method for Atomically Clean Sapphire Surfaces and High Resolution Topographic Method for Their Imaging by Non-Contact Atomic Force Microscopy [J] . Katsube Daiki, Takase Yutaro, Yamashita Hayato, Materials transactions . 2015,第8期

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Atomic Force Microscopy as a Valuable Tool in an Innovative Multi-scale and Multi-technique Non-invasive Approach to Surface Cleaning Monitoring

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