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Verification of crystal growth models by detailed surface microtopography and X-ray diffraction topography

机译：通过详细的表面微观形貌和X射线衍射形貌验证晶体生长模型

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Enckevort W.J.P. van;
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年度 1982
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1. Imaging of inversion twin boundaries in potassium titanyl phosphate (KTP) by liquid-crystal surface decoration and X-ray diffraction topography [J] . Chr. Scherf, Th. Hahn, G. Heger, Philosophical transactions of the Royal Society. Mathematical, physical, and engineering sciences . 1999,第1761期

机译：液晶表面装饰和X射线衍射形貌成像法检测磷酸钛氧钾（KTP）中的孪生孪晶边界
2. Establishment of a new molecular model for mercury determination verified by single crystal X-ray diffraction, spectroscopic analysis and biological potentials [J] . Jiapei Gu, Feifan Zhang, Ziman Zheng, 中国化学快报（英文版） . 2021,第001期

机译：用单晶X射线衍射，光谱分析和生物潜力建立新的汞测定分子模型
3. Surface-Controlled Crystal Alignment of Naphthyl End-Capped Oligothiophene on Graphene: Thin-Film Growth Studied by in Situ X-ray Diffraction [J] . Huss-Hansen Mathias K., Hodas Martin, Mrkyvkova Nada, Langmuir: The ACS Journal of Surfaces and Colloids . 2020,第8期

机译：萘基端升寡核苷烯烃对石墨烯的表面控制晶体对准：通过原位X射线衍射研究的薄膜生长
4. Characterization of Dislocations in 4H-SiC Single Crystals at the Initial Growth Stage by Synchrotron X-ray Topography [C] . Tuerxun Ailihumaer, Hongyu Peng, Yafei Liu, Pacific Rim Meeting on Electrochemical and Solid-State Science . 2020

机译：同步X射线地形初始生长阶段在初始生长阶段的4H-SIC单晶位错的表征
5. Characterization of growth defects in piezoelectric single crystals by synchrotron white beam X-ray topography. [D] . Chen, Huaibin. 2005

机译：通过同步加速器白束X射线形貌表征压电单晶中的生长缺陷。
6. Conformation of d(GGGATCCC)2 in crystals and in solution studied by X-ray diffraction Raman spectroscopy and molecular modelling. [O] . H Fabian, W Hölzer, U Heinemann, 1993

机译：d（GGGATCCC）2在晶体和溶液中的构象通过X射线衍射拉曼光谱和分子建模研究。
7. Studies of Crystal Imperfections in Ice with Reference to the Growth Process by the use of X-Ray Diffraction Topography and Divergent Laue Method [O] . Yukiko Mizuno 1978

机译：通过使用X射线衍射形貌和发散劳关法参考冰晶体缺陷的研究
8. Predicting Grain Growth in Nanocrystalline Materials: A Thermodynamic and Kinetic-Based Model Informed by High Temperature X-ray Diffraction Experiments. [R] . Tschopp, A. M., Darling, A. K., Atwater, A. M., 2014

机译：预测纳米晶材料中的晶粒生长：基于热力学和动力学的模型，通过高温X射线衍射实验得出。

Verification of crystal growth models by detailed surface microtopography and X-ray diffraction topography

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