Partial discharges in voids may cause deterioration of solid insulating materials. They often start in voids enclosed in insulation and or at the interface defects. A method of measuring fast discharge pulses with rise times below 1 ns is reported. Characterisation of partial discharge pulses in artificial voids in polypropylene films at atmospheric pressure is analysed that incorporates inception voltage, apparent and real charge, drift velocity and mobility of electrons.
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