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SHADOW MOIRÉ USING NON-ZERO TALBOT DISTANCE AND APPLICATION OF DIFFRACTION THEORY TO MOIRÉ INTERFEROMETRY

机译:利用非零距离分布的阴影莫雷和衍射理论在莫雷干涉测量中的应用

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摘要

When shadow moiré is practiced in industry for the warpage of microelectronic devices, the required high basic measurement sensitivity limits a dynamic range due to the diffraction effect of the reference grating. An extensive understanding of the contrast and intensity of shadow moiré fringes is required to achieve optical configurations for the measurements. In Part I, an exact mathematical description for the contrast and intensity of shadow moiré fringe is developed using a diffraction theory for a monochromatic light source first. The analysis is extended to study the effect of a broad spectrum light source on the contrast and intensity of shadow moiré fringes. The effect of an aperture on the fringe contrast is defined to propose a complete expression for the contrast of shadow moiré fringe. The mathematical analysis is exploited to define the systematic error from the non-sinusoidal intensity distribution of shadow moiré fringe when the displacement resolution is enhanced using the phase-shifting technique. The results of the mathematical analysis provide a guideline for optimum optical configurations for the required basic measurement sensitivity, which results in a novel technique, called high sensitivity shadow moiré using non-zero Talbot distance (SM-NT). The SM-NT increases the dynamic range substantially and allows the warpage measurements of high-end microelectronics devices, which is not possible with the conventional shadow moiré using the zero Talbot distance. In an achromatic moiré interferometry system, a compensator grating is translated to achieve phase-shifting. The phase-shifting in the achromatic system cannot be explained by the existing theories of moiré interferometry based on the concept of optical path length. In Part II, a diffraction theory is used to explain the phase shifting in the achromatic system. The results reveal that the amount of translation of the compensator grating is proportional to the diffraction order and the frequency of the compensator grating. The diffraction theory based the mathematical description is extended further to define the mini-order diffractions associated with a general deformations. The discrete Fourier transform is employed to characterize the mini-order from a generally deformed grating. The results explain that the magnitude of strain is only parameter to control the angle of mini-order.
机译:当在工业上为微电子器件的翘曲实践阴影波纹时,由于参考光栅的衍射效应,要求的高基本测量灵敏度限制了动态范围。为了获得用于测量的光学配置,需要深入了解阴影莫尔条纹的对比度和强度。在第一部分中,首先使用衍射理论对单色光源进行了精确的数学描述,以说明阴影纹条纹的对比度和强度。扩展分析以研究广谱光源对阴影莫尔条纹的对比度和强度的影响。定义孔径对条纹对比度的影响,以提出阴影纹条纹对比度的完整表达。当通过使用相移技术提高位移分辨率时,利用数学分析从阴影波纹的非正弦强度分布中定义系统误差。数学分析的结果为所需的基本测量灵敏度提供了最佳光学配置的指南,这导致了一种称为非灵敏度Talbot距离(SM-NT)的高灵敏度阴影莫尔条纹。 SM-NT大大增加了动态范围,并允许高端微电子设备进行翘曲测量,而使用零Talbot距离的传统阴影波纹则无法实现。在消色差莫尔干涉仪系统中,补偿光栅被平移以实现相移。消色差系统中的相移不能通过基于光程长度概念的莫尔干涉测量的现有理论来解释。在第二部分中,使用衍射理论来解释消色差系统中的相移。结果表明,补偿光栅的平移量与衍射级次和补偿光栅的频率成正比。基于数学描述的衍射理论进一步扩展,以定义与一般变形相关的微级衍射。离散傅立叶变换用于表征一般变形光栅的微阶。结果表明,应变的大小仅是控制微阶角的参数。

著录项

  • 作者

    Han Chang woon;

  • 作者单位
  • 年度 2005
  • 总页数
  • 原文格式 PDF
  • 正文语种 en_US
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