In electromagnetic interference (EMI) applications, localization of real EMI sources in the near-field region is always in concern. This paper introduces an integrated near-field scanning system (INFSS) that handles electromagnetic near-field measurement of arbitrary 3D shape of high frequency devices in conjunction with numerical modelling and simulation results. It performs both finite element method (FEM) simulation and 3D near-field scanning function that help engineer to increase the project development efficiency and reduce the development time cost. A case study of a dual mode switch parasitic antenna is presented from design to measurement using INFSS.
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