Several test methods are available to examine static and dynamic properties of analog to digital converters (ADCs). The most robust and straightforward ones are codified in international standards released by the IEEE, or by the IEC. These methods have been improved based on ideas proposed in scientific papers published in the field of ADCudtesting. However, there are algorithms and test techniques that are not yet standardized, but could be very useful to achieve more information concerning the device under test. These are predominantly amendments of the standard methods, elaborated to increase the accuracy, robustness, computationuddemand, etc. Nevertheless, it is important to be able to test ADCs strictly according to the standards, and it can also be important to use methods that go beyond the standardized ones in some aspects. This paper presents an idea to harmonize standard and non standard ADC test methods in a single software tool on widely used platform.
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