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The PCIe-based readout system for the LHCb experiment

机译:用于LHCb实验的基于PCIe的读出系统

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摘要

The LHCb experiment is designed to study differences between particles and anti-particles as well as very rare decays in the beauty and charm sector at the LHC. The detector will be upgraded in 2019 in order to significantly increase its efficiency, by removing the first-level hardware trigger. The upgrade experiment will implement a trigger-less readout system in which all the data from every LHC bunch-crossing are transported to the computing farm over 12000 optical links without hardware filtering. The event building and event selection are carried out entirely in the farm. Another original feature of the system is that data transmitted through these fibres arrive directly to computers through a specially designed PCIe card called PCIe40. The same board handles the data acquisition flow and the distribution of fast and slow controls to the detector front-end electronics. It embeds one of the most powerful FPGAs currently available on the market with 1.2 million logic cells. The board has a bandwidth of 480 Gbits/s in both input and output over optical links and 100 Gbits/s over the PCI Express bus to the CPU. We will present how data circulate through the board and in the PC server for achieving the event building. We will focus on specific issues regarding the design of such a board with a very large FPGA, in particular in terms of power supply dimensioning and thermal simulations. The features of the board will be detailed and we will finally present the first performance measurements.
机译:LHCb实验旨在研究LHC粒子与反粒子之间的差异以及美感和魅力领域中非常罕见的衰变。该探测器将在2019年进行升级,以通过去除第一级硬件触发器来显着提高其效率。升级实验将实现一个无触发的读出系统,该系统将每个LHC交叉产生的所有数据通过12000条光链路传输到计算场,而无需进行硬件过滤。事件构建和事件选择完全在服务器场中进行。该系统的另一个原始功能是,通过这些光纤传输的数据通过专门设计的PCIe卡PCIe40直接到达计算机。同一块板可处理数据采集流程,并将快速和慢速控件分配给检测器前端电子设备。它嵌入了目前市场上最强大的FPGA之一,具有120万个逻辑单元。该板通过光链路的输入和输出带宽均为480 Gbit / s,通过PCI Express总线至CPU的带宽为100 Gbit / s。我们将介绍数据如何通过电路板以及在PC服务器中循环以实现事件构建。我们将专注于有关使用超大型FPGA的电路板设计的特定问题,特别是在电源尺寸和热仿真方面。评估板的功能将详细介绍,我们最终将提供首次性能评估。

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