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Correction of SOHO CELIAS/SEM EUV Measurements saturated by extreme solar flare events

机译:对SOHO CELIAS / SEM EUV测量值进行校正的极端太阳耀斑事件饱和

摘要

The solar irradiance in the Extreme Ultraviolet (EUV) spectral bands has been observed with a 15 sec cadence by the SOHO Solar EUV Monitor (SEM) since 1995. During remarkably intense solar flares the SEM EUV measurements are saturated in the central (zero) order channel (0.1 -- 50.0 nm) by the flare soft X-ray and EUV flux. The first order EUV channel (26 -- 34 nm) is not saturated by the flare flux because of its limited bandwidth, but it is sensitive to the arrival of Solar Energetic Particles (SEP). While both channels detect nearly equal SEP fluxes, their contributions to the count rate is sensibly negligible in the zero order channel but must be accounted for and removed from the first channel count rate. SEP contribution to the measured SEM signals usually follows the EUV peak for the gradual solar flare events. Correcting the extreme solar flare SEM EUV measurements may reveal currently unclear relations between the flare magnitude, dynamics observed in different EUV spectral bands, and the measured Earth atmosphere response. A simple and effective correction technique based on analysis of SEM count-rate profiles, GOES X-ray, and GOES proton data has been developed and used for correcting EUV measurements for the five extreme solar flare events of July 14, 2000, October 28, November 2, November 4, 2003, and January 20, 2005. Although none of the 2000 and 2003 flare peaks were contaminated by the presence of SEPs, the January 20, 2005 SEPs were unusually prompt and contaminated the peak. The estimated accuracy of the correction is about 7.5% for large X-class events.
机译:自1995年以来,SOHO太阳能EUV监控器(SEM)以15秒的节奏观察了极紫外(EUV)光谱带中的太阳辐照度。在强烈的太阳耀斑期间,SEM EUV测量值以中央(零级)饱和。耀斑软X射线和EUV通量产生的通道(0.1-50.0 nm)。由于带宽有限,一阶EUV通道(26-34 nm)不会被耀斑通量所饱和,但它对太阳高能粒子(SEP)的到来很敏感。虽然两个通道都检测到几乎相等的SEP通量,但在零阶通道中它们对计数速率的贡献可忽略不计,但必须考虑并从第一个通道计数速率中删除。对于逐渐发生的太阳耀斑事件,SEP对测得的SEM信号的贡献通常遵循EUV峰值。校正极端的太阳耀斑SEM EUV测量可能会揭示耀斑大小,在不同EUV谱带中观察到的动力学与测得的地球大气响应之间当前不清楚的关系。已经开发了一种基于SEM计数率分布,GOES X射线和GOES质子数据分析的简单有效的校正技术,并将其用于校正2000年7月14日(10月28日)的5次极端太阳耀斑事件的EUV测量值, 2003年11月2日,11月4日和2005年1月20日。尽管2000年和2003年的耀斑高峰均未受到SEP的污染,但2005年1月20日的SEP异常迅速并被该峰污染。对于大型X级事件,估计的校正准确性约为7.5%。

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