Structure Detection in Low Intensity X-Ray Images

摘要

In the context of assessing and characterizing structures in X-ray images, we compare different approaches. Most often the intensity level is very low and necessitates a special treatment of Poisson statistics. The method based on wavelet function histogram is shown to be the most reliable one. We also present a multi-resolution filtering method based on the wavelet coefficients detection. Comparative results are presented by means of a simulated cluster of galaxies.