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Operation of microstrip gas chambers manufactured on glass coated with high resistivity diamond-like layers

机译:在涂有高电阻率类金刚石层的玻璃上制造的微带气室的操作

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摘要

We describe recent observations and measurements realized with micro-strip gas chambers (MSGCs) manufactured on boro-silicate glass coated with a thin layer of diamond-like carbon (DLC) having a surface resistivity around 4.10$^{16}\Omega/\Box$. The role of the back-pla electrode configuration and potential in the detector performance has been studied. Even for this very high resistivity of the coatings, MSGCs operate differently from those manufactured on bare boro-silicate glass; the charge gain increases with the radiation flux for counting rates above 103 Hz/mm2, reaching a value 60% higher for 105 Hz/mm2. This behavior does not depend on the presence and potential of the back plane electrode; however, both maximum gain and rate capability are influenced by the drift field. From this study, compared with measurements realized previously with other detectors, we deduce that for stable high rate operation of MSGCs the resistivity of the coating should not exceed ~10$^{15}\Omega/\Box$.
机译:我们描述了最近的观测和测量,这些观测和测量是通过在硼硅酸盐玻璃上制造的微带气室(MSGC)涂覆的,该硼硅酸盐玻璃上涂覆了一层类金刚石碳(DLC),其表面电阻率约为4.10 $ ^ {16} \ Omega / \ Box $。已经研究了后Pla电极结构和电势在检测器性能中的作用。即使涂层具有如此高的电阻率,MSGC的操作也不同于在裸硼硅酸盐玻璃上制造的MSGC。当计数速率超过103 Hz / mm2时,电荷增益随辐射通量的增加而增加,而对于105 Hz / mm2的速率,电荷增益达到60%的值。此行为不取决于背板电极的存在和电势;但是,最大增益和速率能力都受漂移场的影响。根据这项研究,与先前使用其他检测器实现的测量相比,我们得出结论,对于稳定稳定的MSGC高速操作,涂层的电阻率不应超过〜10 $ ^ {15} \ Omega / \ Box $。

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