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A METHOD FOR SEQUENTIAL HIGH RESOLUTION LIGHT AND ELECTRON MICROSCOPY OF SELECTED AREAS OF THE SAME MATERIAL

机译：相同材料选定区域的顺序高分辨率光和电子显微镜的方法

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Schabtach, Eric; Parkening, Terry A.;
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年度 1974
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正文语种 {"code":"en","name":"English","id":9}
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1. A METHOD FOR SEQUENTIAL HIGH RESOLUTION LIGHT AND ELECTRON MICROSCOPY OF SELECTED AREAS OF THE SAME MATERIAL [J] . Eric Schabtach, Terry A. Parkening Journal of cell biology . 1974,第1期

机译：同一材料选定区域的依次高分辨率光和电子显微镜的方法
2. New methods and tools for bioinorganic chemistry-Characterization of size and size distribution of nanoand micro-organic/inorganic materials: a comparison of scanning electron microscopy, dynamic light scattering, and flow field-flow fractionation with multiangle light scattering methods [J] . Ayako Nakamura, Haruhisa Kato Journal of biological inorganic chemistry: JBIC: a publication of the Society of Biological Inorganic Chemistry . 2014,第Null期

机译：生物无机化学的新方法和工具-表征纳米和微生物/无机材料的尺寸和尺寸分布：扫描电子显微镜，动态光散射和流场-流分馏与多角度光散射方法的比较
3. Morphometric, quantitative, and three-dimensional analysis of the heart muscle fibers of old rats: Transmission electron microscopy and high-resolution scanning electron microscopy methods [J] . Cury D.P., Dias F.J., Sosthenes M.C.K., Microscopy research and technique . 2013,第2期

机译：老年大鼠心肌纤维的形态，定量和三维分析：透射电子显微镜和高分辨率扫描电子显微镜方法
4. Application of selected electron microscopy methods to materials analysis problems [C] . A. Rucki, H. Cerva Symposium Analytical Techniques for Semiconductor Materials and Process Characterization V;ALTECH 2007;Solid State Device Research Conference; 20070913-14;20070913-14;20070913-14; Munich(DE);Munich(DE);Munich(DE) . 2007

机译：所选电子显微镜方法在材料分析中的应用
5. III-V compound semiconductor material characterization of microstructures and nanostructures on various optoelectronic devices with analytical transmission electron microscopy and high resolution electron microscopy . [D] . Zhou, Wei. 2004

机译：III-V型化合物半导体材料表征的各种光电子器件的微结构和纳米结构的分析透射电子显微镜和高分辨率电子显微镜。
6. A METHOD FOR SEQUENTIAL HIGH RESOLUTION LIGHT AND ELECTRON MICROSCOPY OF SELECTED AREAS OF THE SAME MATERIAL [O] . Eric Schabtach, Terry A. Parkening 1974

机译：相同材料选定区域的顺序高分辨率光和电子显微镜的方法
7. Annular Bright-Field Scanning Transmission Electron Microscopy: Direct and Robust Atomic-Resolution Imaging of Light Elements in Crystalline Materials [O] . Scott D. Findlay, Naoya Shibata, Yuichi Ikuhara, 2017

机译：环形亮场扫描透射电子显微镜：结晶材料中的轻质元素的直接和鲁棒原子分辨率成像

A METHOD FOR SEQUENTIAL HIGH RESOLUTION LIGHT AND ELECTRON MICROSCOPY OF SELECTED AREAS OF THE SAME MATERIAL

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