首页> 外文OA文献 >Acoustic characterization of two megasonic devices for photomask cleaning
【2h】

Acoustic characterization of two megasonic devices for photomask cleaning

机译:用于清洁光罩的两个兆声波设备的声学特性

代理获取
本网站仅为用户提供外文OA文献查询和代理获取服务,本网站没有原文。下单后我们将采用程序或人工为您竭诚获取高质量的原文,但由于OA文献来源多样且变更频繁,仍可能出现获取不到、文献不完整或与标题不符等情况,如果获取不到我们将提供退款服务。请知悉。

摘要

Wet photomask cleaning relies on megasonic agitation to enhance the process, but there are many challenges to reliably maximize particle removal efficiency (PRE) and minimize damage. With the shift to pellicle-free EUV masks, photomask processes are more vulnerable to contamination, increasing the urgency to improve the cleaning process. This difficulty is largely due to the unavailability of appropriate measurement of the acoustic field. Typically all that is known about the acoustic output is the driving frequency and the electric power delivered to a transducer, both global parameters that tell little about the field distribution over the substrate, the actual amplitude of the sound at the substrate, or the levels of cavitation (stable and transient) present at the substrate. © (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE).
机译:湿式光掩模清洗依靠兆声波搅拌来增强工艺,但是要可靠地最大程度地提高颗粒去除效率(PRE)并最大程度地减少损害,仍然存在许多挑战。随着转向无防护膜的EUV掩模,光掩模工艺更容易受到污染,从而增加了改善清洁工艺的紧迫性。该困难主要是由于无法适当地测量声场。通常,关于声输出的所有已知信息就是驱动频率和传递到换能器的电功率,这两个全局参数几乎不能说明基板上的场分布,基板上声音的实际振幅或声压级。出现在基材上的气蚀(稳定和短暂)。 ©(2016)版权,光电仪器工程师协会(SPIE)。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
代理获取

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号