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Development of Reactive Ion Scattering Spectrometry (RISS) as an Analytical Surface Characterization Technique

机译:反应性离子散射光谱法(RISS)的开发,作为分析表面表征技术

摘要

Reactive ion scattering spectrometry (RISS) utilizing low energy (tens of eV) polyatomic ions was employed to characterize self-assembled monolayers (SAMs) on gold. The terminal composition of halogenated SAMs, chemisorption motifs of disulfide and diselenide SAMs, and electron transfer properties of molecular wire containing SAMs were interrogated to develop the versatility of RISS as an analytical surface characterization technique.Novel halogen terminated SAMs were examined for their ability to convert translational to vibrational energy of colliding projectile ions. A general increasing energy deposition trend correlated with increasing terminal mass with the exception of the iodine functionality. Increased amounts of surface abstractions and sputtering from C12I suggest competitive ion-surface interactions account for less than predicted energy deposition results. Mixed films of CH2Br and CH3 terminal groups elucidated interfacial surface crowding discerned by energy deposition results.Thiol and disulfide based SAMs were shown by RISS comparisons to be dissimilar in structure. Terminal orientation, however, was the same based on ion-surface reactions, disproving the proposed dimer model of disulfide SAMs. Ion-surface reactions and electron transfer properties of disulfide surfaces suggested greater percentages of c(4x2) superlattice structure than in thiol SAMs. Based on increased hydrogen reactivity, decreased methyl reactivity, and increased energy deposition results, diselenide based SAMs were more disordered than S-Au based SAMs. Electron transfer results monitored through total ion currents (TIC) showed Se-Au contacts are more conductive than S-Au attachments.Molecular wire candidates whose electron transfer capabilities are difficult to characterize by traditional techniques were characterized by RISS after being doped into matrix SAMs. Electron transfer properties were dependent on the isolating SAM matrix, dipole moments of the wires, and the potential applied to the surface. Changes in surface voltage dictated molecular wire geometry and electron transfer. Wires were annealed into preferential geometries by colliding ions, but did not operate as switches.While not related to the advancement of RISS, structural elucidation of the pharmaceutical carvidioliol was investigated by collision-induced dissociation, surface-induced dissociation, sustained off-resonance irradiation, and sustained off-resonance irradiation-resonant excitation and through gas-phase hydrogen/deuterium exchange. This molecule fragmented easily by all methods and demonstrated the chemical specificity of gas-phase hydrogen/deuterium exchange experiments.
机译:利用低能量(数十eV)多原子离子的反应离子散射光谱法(RISS)表征了金上的自组装单分子膜(SAMs)。考察了卤化SAM的末端组成,二硫化物和二硒化SAM的化学吸附基序以及含分子SAM的分子线的电子传递性质,以开发RISS的多功能性作为分析表面表征技术。研究了新型卤素封端SAM的转化能力。碰撞的弹丸离子转化为振动能。除了碘功能以外,能量沉积的总体趋势与终端质量的增加相关。从C12I提取表面和进行溅射的数量增加,表明竞争性的离子-表面相互作用所占的能量少于预期的能量沉积结果。 CH2Br和CH3端基的混合膜阐明了通过能量沉积结果识别的界面表面拥挤。RISS比较表明,基于硫醇和二硫化物的SAMs在结构上不相似。然而,基于离子表面反应的末端取向是相同的,从而证明了所提出的二硫SAM的二聚体模型。离子表面反应和二硫键表面的电子转移特性表明,c(4x2)超晶格结构的百分比高于硫醇SAMs。基于增加的氢反应性,降低的甲基反应性和增加的能量沉积结果,基于二硒化物的SAM比基于S-Au的SAM更无序。通过总离子流(TIC)监测的电子转移结果表明,Se-Au触点比S-Au附件具有更高的导电性。将传统电子技术难以表征的分子线候选物掺杂到基质SAM中后,通过RISS对其进行表征。电子传递特性取决于绝缘SAM矩阵,导线的偶极矩以及施加到表面的电势。表面电压的变化决定了分子丝的几何形状和电子转移。导线通过碰撞离子退火成优先的几何形状,但没有作为开关起作用。尽管与RISS的发展无关,但通过碰撞诱导解离,表面诱导解离,持续失谐辐射研究了药物卡维地洛尔的结构解析,并通过气相氢/氘交换实现持续的非共振辐射-共振激发。该分子可通过所有方法轻松地裂解,并证明了气相氢/氘交换实验的化学特异性。

著录项

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    Joyce Karen Elaine;

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  • 年度 2008
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  • 原文格式 PDF
  • 正文语种 EN
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