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Analytical Model for Relating FPGA Logic and Routing Architecture Parameters to Post-Routing Wirelength

机译:将FPGA逻辑和路由架构参数与后路由线长相关联的分析模型

摘要

Analytical models have been introduced for rapidly evaluating the impact of architectural design choices on FPGA performance through model-based trend analysis. Modeling wirelength is a critical problem since channel width can be expressed as a function of total net length in a design, which is an indicator of routability for an FPGA. Furthermore, performance indicators, such as critical path delay and power consumption, are functions of net capacitance, which in turn is a function of net length. The analytical models to this date mainly originate from extracting circuit characteristics from post-placement stage of the CAD flow, which instills a strong binding between the model and the optimization objective of the CAD flow. Furthermore, these models primarily take only logic architecture features into account. In this study, we present a post-routing wirelength model that takes into account both logic and routing architectural parameters, and that does not rely on circuit characteristics extracted from any stage of the FPGA CAD flow. We apply a methodological approach to model parameter tuning as opposed to relying on a curve-fitting method, and show that our model accurately captures the experimental trends in wirelength with respect to changes in logic and routing architecture parameters individually. We demonstrate that the model accuracy is not sacrificed even if the performance objective of the CAD flow changes or the algorithms used by individual stages of the CAD flow (technology mapping, clustering, and routing) change. We swap the training and validation benchmarks, and show that our model development approach is robust and the model accuracy is not sacrificed. We evaluate our model based on new set of benchmarks that are not part of the training and validation benchmarks, and demonstrate its superiority over the state of the art. Based on the swapping based experiments, we show that the model parameters take values in a fixed range. We verify that this range holds its validity even for benchmarks that are not part of the training and validation benchmarks. We finally show that our model maintains a good estimation of the empirical trends even when very large values are used for the logic block architecture parameter.
机译:引入了分析模型,用于通过基于模型的趋势分析快速评估架构设计选择对FPGA性能的影响。布线长度建模是一个关键问题,因为在设计中通道宽度可以表示为总净长度的函数,这是FPGA布线能力的指标。此外,性能指标(例如关键路径延迟和功耗)是净电容的函数,而净电容又是净长度的函数。迄今为止的分析模型主要来自于从CAD流程的放置后阶段提取电路特性,这在模型和CAD流程的优化目标之间形成了强大的约束力。此外,这些模型主要只考虑逻辑架构功能。在本研究中,我们提出了一种路由选择后的线长模型,该模型同时考虑了逻辑和路由架构参数,并且不依赖于从FPGA CAD流程的任何阶段提取的电路特性。我们采用一种方法学方法来对模型参数进行调整,而不是依赖于曲线拟合方法,并且表明我们的模型可以准确地捕获线长相对于逻辑和布线体系结构参数的变化的实验趋势。我们证明,即使CAD流程的性能目标发生变化或CAD流程的各个阶段使用的算法(技术映射,聚类和工艺路线)发生变化,也不会牺牲模型的准确性。我们交换了训练和验证基准,并表明我们的模型开发方法是可靠的,并且不会牺牲模型的准确性。我们基于不属于培训和验证基准的一部分新基准对我们的模型进行评估,并证明其相对于现有技术的优越性。基于基于交换的实验,我们表明模型参数采用固定范围内的值。我们验证该范围即使对于不属于培训和验证基准的基准也能保持其有效性。最后,我们证明了即使对逻辑块体系结构参数使用了非常大的值,我们的模型仍可以很好地估计经验趋势。

著录项

  • 作者

    Soni Arpit;

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  • 年度 2016
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  • 原文格式 PDF
  • 正文语种 en_US
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