Design and construction of the Ultimate Ellipsometer, and evaluation of sol-gel derived electro-optic and magneto-optic thin films.

摘要

The design and implementation details of an advanced type of optical measurement device are presented (the Ultimate Ellipsometer). Design and functional details of its major components and subcomponents are described. A list of its optical measurement capabilities (polarization rotation and ellipticity, grating diffraction order efficiencies and polarization state measurements, magneto-optic, and electro-optic measurements) is presented, along with various measurement results. In addition, optical, magneto-optical, and electro-optical characterization results of sol-gel derived bismuth doped dysprosium iron garnet (B.I.G.), lead zirconate titanate (PZT), and lead lanthanum zirconate titanate (PLZT) thin films are presented.