首页> 外文OA文献 >CHARACTERIZATION OF CHARGE INJECTION PROCESSES OF THIN FILMS ON INDIUM TIN OXIDE ELECTRODES USING A NOVEL SPECTROELECTROCHEMICAL TECHNIQUE: POTENTIAL-MODULATED ATTENUATED TOTAL REFLECTANCE SPECTROSCOPY
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CHARACTERIZATION OF CHARGE INJECTION PROCESSES OF THIN FILMS ON INDIUM TIN OXIDE ELECTRODES USING A NOVEL SPECTROELECTROCHEMICAL TECHNIQUE: POTENTIAL-MODULATED ATTENUATED TOTAL REFLECTANCE SPECTROSCOPY

机译:新型分光电化学技术表征氧化铟锡电极上薄膜的电荷注入过程:电位调制衰减全反射光谱

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摘要

Understanding interfacial charge injection processes is one of the key factors needed for development of efficient organic electronic devices, such as biosensors and energy conversion systems, since these processes control the electrical characteristics of these devices. Spectroelectrochemical characterization of electron transfer processes occurring at the electrode - electroactive thin film interface has been evaluated to improve our understanding of charge transfer kinetics using a novel form of electroreflectance spectroscopy, potential-modulated attenuated total reflectance (PM-ATR), which makes it possible to sensitively monitor spectroscopic changes in thin films as a function of applied potential.PM-ATR was used to evaluate three different redox-active films deposited on indium tin oxide (ITO) electrodes to investigate: i) the orientation dependence of charge transfer rates of thin films of biomolecules, ii) surface treatment and modification effects on charge transfer kinetics of conducting polymers and, iii) estimation of rates of electron injection and conduction band edge of semiconductor nanocrystalline materials.First, Prussian blue film as a model system was used successfully to examine the PM-ATR technique for determination of the charge transfer rate constant between ITO and a molecular film.Second, an anisotropic and redox active protein film, cytochrome c, was used to probe charge transfer rates with respect to molecular orientation. The electron transfer rate measured using TM polarized light was four-fold greater than that measured using TE polarized light. These data are the first to correlate a distribution of molecular orientations with a distribution of electron transfer rates in a redox-active molecular film.Third, the effects of ITO surface treatment and modification on charge transfer kinetics on a conducting polymer, poly(3,4-ethylenedioxythiophene/)/poly(styrenesulfonate) (PEDOT/PSS), were studied. The apparent interfacial charge transfer rate constant for PEDOT/PSS on ITO has been reported for the first time which cannot be measured otherwise with conventional electrochemistry due to high non-Faradaic background of PEDOT/PSS films.Fourth, PM-ATR enabled characterization of reversible redox processes between submonolayer coverages of surface-tethered, CdSe nanocrystals and ITO for the first time. Optically determined onset potentials for electron injection were used for estimation for the conduction band and valance band energies (ECB and EVB, respectively).
机译:了解界面电荷注入过程是开发高效有机电子设备(如生物传感器和能量转换系统)所需的关键因素之一,因为这些过程控制着这些设备的电特性。评估了在电极-电活性薄膜界面处发生的电子转移过程的光谱电化学特性,以改进我们对电荷转移动力学的理解,方法是使用新型形式的电反射光谱法,即电势调制衰减全反射(PM-ATR),这使它成为可能PM-ATR用于评估沉积在铟锡氧化物(ITO)电极上的三种不同的氧化还原活性膜,以研究:i)电荷转移速率的取向依赖性生物分子薄膜,ii)表面处理和修饰对导电聚合物的电荷转移动力学的影响,iii)估计半导体纳米晶体材料的电子注入速率和导带边缘。首先,成功地使用普鲁士蓝膜作为模型系统检查PM-ATR技术以确定电荷ITO和分子膜之间的传输速率常数。其次,使用各向异性和氧化还原活性蛋白膜,细胞色素c来探测相对于分子取向的电荷传输速率。使用TM偏振光测量的电子传输速率是使用TE偏振光测量的电子传输速率的四倍。这些数据是第一个将分子取向分布与氧化还原活性分子膜中电子转移速率分布相关的数据。第三,ITO表面处理和改性对导电聚合物poly(3,研究了4-乙撑二氧噻吩/)/聚(苯乙烯磺酸盐)(PEDOT / PSS)。首次报道了ITO上PEDOT / PSS的表观界面电荷转移速率常数,由于PEDOT / PSS膜具有很高的非法拉第背景,因此无法用常规电化学方法进行测量。第四,PM-ATR可以表征可逆首次在表面束缚的CdSe纳米晶体和ITO的亚单层覆盖之间进行氧化还原过程。使用光学确定的电子注入起始电位来估算导带和价带能量(分别为ECB和EVB)。

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    Araci Zeynep;

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  • 年度 2010
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  • 原文格式 PDF
  • 正文语种 en
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