首页> 外文OA文献 >ELECTRON BOMBARDMENT OF CERTAIN THIN FILMS DURING DEPOSITION (ANTIMONY TRIOXIDE, SILICON MONOXIDE, ZINC SULFIDE, POTASSIUM HEXAFLUOROZIRCONATE).
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ELECTRON BOMBARDMENT OF CERTAIN THIN FILMS DURING DEPOSITION (ANTIMONY TRIOXIDE, SILICON MONOXIDE, ZINC SULFIDE, POTASSIUM HEXAFLUOROZIRCONATE).

机译:沉积过程中某些薄膜的电子轰击(三氧化二锑,一氧化硅,硫化锌,六氟正磷酸钾)。

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摘要

The performance of multilayer thin film optical filters depends largely on the microstructure of the component layers. This microstructure varies with the deposition parameters inside the coating chamber. By controlling these parameters, optical filters can be produced to exacting specifications. In 1947, R. M. Rice established the technique of bombarding the substrate with electrons of several kilovolts as the fils were being deposited. This process improved the durability of zinc sulfide films dramatically. This study was performed to quantitatively analyze the effects of bombardment on film microstructure and subsequent effects on optical and mechanical properties. I installed an electron source filament inside the coating chamber and electrically isolated the substrate holder, which was connected to a positive high voltage supply. An accelerating loop placed just above the filament enhanced its efficiency. The source was calibrated by measuring the current through the substrate holder. Single layer films of five different materials were deposited, each at its own set of electron bombardment parameters. The microstructure was analyzed with an X-ray diffractometer and a transmission electron microscope. Optical properties were measured with guided waves, induced absorption, and spectrophotometric analysis. Film durability was analyzed with scotch tape, eraser, and controlled humidity tests. Antimony trioxide films showed a shift in lattice orientation, but this did not affect columnar structure or macroscopic quantities. Potassium hexafluorozirconate films showed elimination of both crystal structure and columnar growth, resulting in slightly reduced durability and some absorption. Silicon monoxide films suffered no change in structure or properties. Zinc sulfide films demonstrated the change in crystal structure, which was quantified and shown to improve moisture resistance. Optical properties were unaffected. Magnesium fluoride films showed a slight increase in crystallinity with only subtle changes in durability and optical properties. Generally, electron bombardment reduced or rearranged crystal structure. The effects on macroscopic properties varied with each material, with no clear trend evident.
机译:多层薄膜光学滤波器的性能在很大程度上取决于组成层的微观结构。该微结构随涂覆室内部的沉积参数而变化。通过控制这些参数,可以生产出符合严格规格的滤光片。 1947年,R。M. Rice建立了一种技术,在沉积薄膜时用几千伏的电子轰击基板。该方法极大地提高了硫化锌膜的耐久性。进行这项研究是为了定量分析轰击对薄膜微结构的影响以及随后对光学和机械性能的影响。我在涂层室内安装了一个电子源灯丝,并电隔离了与正高压电源相连的基板支架。位于灯丝正上方的加速环提高了其效率。通过测量流经基板支架的电流来校准光源。沉积了五种不同材料的单层膜,每种膜都有自己的电子轰击参数集。用X射线衍射仪和透射电子显微镜分析微观结构。用导波,诱导吸收和分光光度法测量光学性质。使用透明胶带,橡皮擦和受控湿度测试分析了薄膜的耐久性。三氧化二锑薄膜显示出晶格取向的变化,但这并不影响柱状结构或宏观量。六氟锆酸钾薄膜显示出晶体结构和柱状生长均消失,导致耐久性和吸收率略有降低。一氧化硅膜的结构或性能没有变化。硫化锌膜显示出晶体结构的变化,该变化被量化并显示出改善的耐湿性。光学性质不受影响。氟化镁膜的结晶度略有增加,而耐久性和光学性能仅发生细微变化。通常,电子轰击会减少或重新排列晶体结构。每种材料对宏观性能的影响各不相同,没有明显的趋势。

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    BROWNING STEPHEN DOUGLAS.;

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  • 年度 1983
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  • 正文语种 en
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