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On the Treatments of TE Mode Edge Conditions in the FDTD Method and Its Applications to the Microwave Circuit Analysis

机译：FDTD方法中TE模式边缘条件的处理及其在微波电路分析中的应用

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作者
打矢匡; 鈴木康介; 柏達也; UCHIYA Masashi; SUZUKI Kosuke; KASHIWA Tatsuya;
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年度 2000
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原文格式 PDF
正文语种 ja
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1. Efficient Analysis of Geometrical Uncertainty in the FDTD Method Using Polynomial Chaos With Application to Microwave Circuits [J] . Austin A.C.M., Sarris C.D. IEEE Transactions on Microwave Theory and Techniques . 2013,第12aPart2期

机译：FDTD方法中多项式混沌的几何不确定性有效分析及其在微波电路中的应用
2. System-Combined ADI-FDTD Method and Its Electromagnetic Applications in Microwave Circuits and Antennas [J] . Naixing Feng, Yuxian Zhang, Xiaoqing Tian, IEEE Transactions on Microwave Theory and Techniques . 2019,第8期

机译：系统组合的ADI-FDTD方法及其在微波电路和天线中的电磁应用
3. Global modeling of microwave applications by combining the FDTD method and a general semiconductor device and circuit simulator [J] . Witzig A., Schuster C. IEEE Transactions on Microwave Theory and Techniques . 1999,第6期

机译：通过将FDTD方法与一般的半导体器件和电路模拟器相结合，对微波应用进行全局建模
4. Application of the PML absorbing boundary condition to the FDTD analysis of microwave circuits [C] . Bahr, A., Lauer, . 1995

机译：PML吸收边界条件在微波电路FDTD分析中的应用
5. Extension of FDTD absorbing boundary condition methods to lossy dielectrics for the modeling of microwave devices. [D] . Wittwer, David Christian. 1998

机译：将FDTD吸收边界条件方法扩展到有损耗电介质，以进行微波设备建模。
6. Effect of Electric Field Distribution on the Heating Uniformity of a Model Ready-to-Eat Meal in Microwave-Assisted Thermal Sterilization Using the FDTD Method [O] . Yoon-Ki Hong, Roger Stanley, Juming Tang, 2021

机译：电场分布对使用FDTD方法微波辅助热灭菌在微波辅助膳食的型号的加热均匀性的影响
7. Extension of FDTD absorbing boundary condition methods to lossy dielectrics for the modeling of microwave devices [O] . Wittwer David Christian 1970- 1998

机译：将FDTD吸收边界条件方法扩展到用于微波器件建模的有损电介质
8. The Application of the FDTD Method to Millimeter-Wave Filter Circuits Including the Design and Analysis of a Compact Coplanar [R] . Oswald, J. E., Siegel, P. H. 1994

机译：FDTD方法在毫米波滤波器电路中的应用，包括紧凑共面的设计与分析

On the Treatments of TE Mode Edge Conditions in the FDTD Method and Its Applications to the Microwave Circuit Analysis

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