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In situ magnetoresistance measurements of ferromagnetic nanocontacts in the Lorentz transmission electron microscope

机译:Lorentz透射电子显微镜中铁磁纳米接触的原位磁阻测量

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摘要

We report on in situ magnetoresistance measurements of a 30-nm-wide ferromagnetic nanocontact with simultaneous magnetic imaging in the Lorentz transmission electron microscope. The magnetoresistive measurements are correlated with the micromagnetic configuration of the sample. This allows us to assign characteristic features in the magnetoresistance curves to different magnetic configurations of the sample. From our experiments we can conclude that the micromagnetic configuration of the whole sample—not only the nanocontact region—has to be taken into account for the interpretation of magnetoresistive effects or hysteresis loops. Micromagnetic simulations were performed which confirm the experimental results.
机译:我们报告了在洛伦兹透射电子显微镜中同时进行磁成像的30 nm宽铁磁纳米接触的原位磁阻测量。磁阻测量值与样品的微磁结构相关。这使我们能够将磁阻曲线中的特征分配给样品的不同磁配置。从我们的实验中可以得出结论,在解释磁阻效应或磁滞回线时,必须考虑整个样品的微磁结构,而不仅仅是纳米接触区域。进行了微磁仿真,证实了实验结果。

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