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Direct wide-angle measurement of photonic band-structure in a three-dimensional photonic crystal using infrared fourier imaging spectroscopy

机译:使用红外傅里叶成像光谱法直接广角测量三维光子晶体中的光子能带结构

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摘要

We propose a method to directly visualize the photonic band-structure of micrometer-sized photonic crystals using wide-angle spectroscopy. By extending Fourier imaging spectroscopy sensitivity into the infrared range, we have obtained accurate measurements of the band structures along the high-symmetry directions (X-W-K-L-U) of polymeric three-dimensional, rod-connected diamond photonic crystals. Our implementation also allows us to record single wavelength reflectance far-field patterns showing very good agreement with simulations of the same designs. This technique is suitable for the characterization of photonic structures working in the infrared and, in particular, to obtain band-structure information of complete photonic band gap materials.
机译:我们提出了一种使用广角光谱法直接可视化微米级光子晶体的光子能带结构的方法。通过将傅里叶成像光谱的灵敏度扩展到红外范围,我们已经获得了沿着聚合物三维,棒状连接的金刚石光子晶体的高对称方向(X-W-K-L-U)的能带结构的准确测量结果。我们的实现方式还使我们能够记录单波长反射远场图形,该图形与相同设计的仿真非常吻合。该技术适用于表征在红外中工作的光子结构,尤其适用于获得完整光子带隙材料的能带结构信息。

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