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Compact microwave ion source for extremely low energy ion irradiation system

机译:紧凑的微波离子源,用于极低能量的离子辐照系统

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摘要

The performance of a compact microwaveion source developed for extremely low energy ion extraction was measured. The ion source was modified to be fitted for the ion extraction at the voltage lower than 100 V. The current–voltage characteristics, mass spectrum, absolute ion energy, and energy spread of argon ion beam were estimated with a sector magnet. The results showed that the mass spectrum showed a clear separation of singly charged ions and doubly charged ions even at the extraction voltage of 4 V. Mass separated Ar[+] current of 0.5 nA at 4 V extraction was obtained. An excess ion energy due to presence of plasma potential was 14 eV at the pressure of 5×10[−3] Pa, and 66 eV at 9×10[−4] Pa. Energy spread was narrower than 12 eV, from rough estimate of the mass spectrum. These results summarize that the present ion source can be used for extremely low energy ion irradiation system.
机译:测量了开发用于极低能量离子提取的紧凑型微波源的性能。修改了离子源,使其适合在低于100 V的电压下进行离子提取。使用扇形磁体估算了电流-电压特性,质谱,绝对离子能量和氩离子束的能量扩散。结果表明,即使在4 V的提取电压下,质谱也能清楚地分离出单电荷离子和双电荷离子。在4 V提取条件下,获得质量分离的Ar [+]电流为0.5 nA。由于存在等离子电势,在5×10 [−3] Pa的压力下产生的过量离子能量为14 eV,在9×10 [−4] Pa的压力下为66 eV。根据粗略估计,能量分布窄于12 eV质谱图这些结果表明,本发明的离子源可用于极低能量的离子辐照系统。

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