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>Analysis of Build-up Process of CA Multilayers on the Basis of IR Spectroscopic and Ellipsometric Data (Commemoration Issue Dedicated to Professor Tohru Takenaka On the Occasion of His Retirement)
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Analysis of Build-up Process of CA Multilayers on the Basis of IR Spectroscopic and Ellipsometric Data (Commemoration Issue Dedicated to Professor Tohru Takenaka On the Occasion of His Retirement)