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Abnormal Behavior of Hydrogen Response and Hydrogen Induced Linear Expansion Coefficient of Pd-Cu-Si Metallic Glassy Alloys for Thin Film Hydrogen Sensor

机译:薄膜氢传感器用Pd-Cu-Si金属玻璃态合金的氢响应和氢致线性膨胀系数的异常行为

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摘要

Thin films of Pd-Cu-Si metallic glassy alloys of varying composition were prepared by simultaneous three sources (Pd, Cu and Si) sputtering method using a rotating mechanism of substrates. Their H2 responses were observed by measuring the electric resistance changes of them exposed in N2 and H2. In addition, their linear expansion coefficients (LECs) induced by absorbed hydrogen were also measured. Contrary to a normal H2 response transient with a rapid increase in electric resistance of a thin film, several thin films indicated abnormal H2 response transients consisting of complex changes, an increase and a decrease, in electric resistance when the thin films were exposed in H2. These thin films have higher Pd/Si atomic ratios than those indicated normal H2 response transients. Additionally, by the characterization of the thin films, the existence of Pd-nanocrystals of about 2 nm in diameter was observed in the amorphous matrix which possibly includes Pd-clusters as well as Pd atoms. The mechanism of the abnormal H2 response transient can be explained by two conflicting behaviors in electric resistance of the thin films when they are exposed in H2: a decrease by the formation of electrical contacts of Pd-nanocrystals connected with volume expanded Pd-clusters by hydrogen absorption and a following increase by hydrogenation of Pd-nanocrystals. Observed time lags between two conflicting behaviors can be explained by the different transfer speeds of hydrogen relating to two kinds of pathways: inside of Pd-nanocrystals and the amorphous matrix along which hydrogen atoms transfer in the structure. The Pd-nanocrystals also affected on LEC and the H2 response significantly. The thin films with them indicated much higher LEC than the thin films without them. However, the thin films with them did not indicate the high H2 response expected from their high LEC. The result of LEC suggests that Pd-nanocrystals can absorb much more hydrogen atoms than Pd in an amorphous matrix. The Pd in an amorphous matrix is supposed to be Pd-clusters, randomly distributed Pd atoms and Pd atoms forming a trigonal prism that is a structural unit of the Pd-Cu-Si alloys. On the other hand, the high H2 response according to the high amount of absorbed hydrogen can not be expected in the thin films with Pd-nanocrystals, due to a decrease in electric resistance by forming electrical contacts of the Pd-nanocrystals.
机译:利用基板的旋转机理,通过同时三种源(Pd,Cu和Si)溅射方法,制备了组成不同的Pd-Cu-Si金属玻璃合金薄膜。通过测量它们暴露在N2和H2中的电阻变化来观察它们的H2响应。另外,还测量了由吸收的氢引起的它们的线性膨胀系数(LEC)。与正常的H2响应瞬态相反,薄膜的电阻迅速增大,当薄膜暴露在H2中时,一些薄膜表明异常的H2响应瞬态包括复杂的电阻变化,电阻的增大和减小。这些薄膜的Pd / Si原子比高于正常的H2响应瞬变。另外,通过薄膜的表征,在非晶基质中观察到存在直径约2nm的Pd纳米晶体,该非晶基质可能包括Pd团簇和Pd原子。异常的H2响应瞬态的机制可以用薄膜在H2中暴露时的电阻的两个冲突行为来解释:通过与氢形成体积膨胀的Pd团簇相连的Pd纳米晶体的电接触而减少Pd-纳米晶体的氢化吸收和随后的增加。观察到的两种相互矛盾的行为之间的时间滞后可以通过氢与两种途径有关的不同转移速度来解释:Pd-纳米晶体内部和氢原子沿其在结构中转移的无定形基质。钯纳米晶体也显着影响LEC和H2响应。具有它们的薄膜比没有它们的薄膜具有更高的LEC。然而,带有它们的薄膜并未显示出其高LEC所期望的高H2响应。 LEC的结果表明,Pd纳米晶体比非晶态基质中的Pd吸收更多的氢原子。假定非晶态基体中的Pd是Pd团簇,它们是随机分布的Pd原子,并且Pd原子形成三角棱镜,是Pd-Cu-Si合金的结构单元。另一方面,由于通过形成Pd-纳米晶体的电接触而导致电阻降低,因此在具有Pd-纳米晶体的薄膜中不能期望根据高吸收的氢而产生的高H 2响应。

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