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Surface structures of binary mixtures of imidazolium-based ionic liquids using high-resolution Rutherford backscattering spectroscopy and time of flight secondary ion mass spectroscopy.

机译:咪唑鎓离子液体的二元混合物的表面结构,采用高分辨率卢瑟福反向散射光谱和飞行时间二次离子质谱。

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摘要

Surface structures of binary mixtures of imidazolium-based ionic liquids having a common anion (bis(trifluoromethanesulfonyl)imide ([TFSI]), namely [C2MIM]1-x[C10MIM]x[TFSI] (x = 0.5 and 0.1), are studied using high-resolution Rutherford backscattering spectroscopy (HRBS) and time of flight secondary ion mass spectroscopy (TOF-SIMS). Although both measurements show surface segregation of [C10MIM] the degrees of the segregation are different. The surface fraction xsurf of [C10MIM] is estimated to be 0.6 ± 0.05 and 0.18 ± 0.02 by HRBS for x = 0.5 and 0.1, respectively. On the other hand, TOF-SIMS indicates much stronger surface segregation, namely xsurf = 0.83 ± 0.03 and 0.42 ± 0.04 for x = 0.5 and 0.1, respectively. The observed discrepancy can be attributed to the difference in the probing depth between HRBS and TOF-SIMS. The observed surface segregation can be roughly explained in terms of surface tension.
机译:具有共同阴离子(双(三氟甲烷磺酰基)酰亚胺([TFSI]),即[C2MIM] 1-x [C10MIM] x [TFSI](x = 0.5和0.1)的咪唑基离子液体的二元混合物的表面结构为使用高分辨率卢瑟福背散射光谱(HRBS)和飞行时间二次离子质谱(TOF-SIMS)进行了研究,尽管两种测量均显示[C10MIM]的表面偏析,但偏析程度不同。对于x = 0.5和0.1,HRBS估计]分别为0.6±0.05和0.18±0.02;另一方面,TOF-SIMS显示更强的表面偏析,即xsurf = 0.83±0.03和0.42±0.04,对于x =分别为0.5和0.1,观察到的差异可以归因于HRBS和TOF-SIMS之间的探测深度的差异,观察到的表面偏析可以用表面张力来粗略解释。

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