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Positive binding energy of a biexciton confined in a localization center formed in a single InxGa1-xN/GaN quantum disk

机译:限制在单个InxGa1-xN / GaN量子盘中形成的局域中心的双激子的正结合能

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摘要

We report microphotoluminescence spectroscopy performed on individual and ensemble InGaN/GaN quantum disks (Q-disks). The typical spectrum of a single Q-disk exhibited the contribution of localization centers (LCs) formed in the InGaN active layer of the Q-disks, characterized by sharp lines appearing on the low energy side of the spectra. In addition, a broader emission peak identified as the luminescence of the quasi-two-dimensional (2D) InGaN active layer surrounding the LCs appears systematically at higher energy. Time-resolved photoluminescence experiment performed on single Q-disks exhibited the excitonic transfer, from the 2D InGaN active layer to LCs, at the submicroscopic scale. Excitation power dependence studies and linear polarization analysis allowed us to identify a biexciton complex confined in a LC in a single Q-disk with a surprising positive binding energy of 13 meV. The absence of screening effect by increasing the excitation power density and the fast excitonic radiative lifetime of a few hundred picoseconds that we measured on several individual Q-disks indicate that the absence of internal electric field in the structure can explain the observed positive biexciton binding energy.
机译:我们报告了对单个和整体InGaN / GaN量子盘(Q盘)执行的微光致发光光谱。单个Q磁盘的典型光谱表现出在Q磁盘的InGaN有源层中形成的定位中心(LC)的贡献,其特征在于在光谱的低能侧出现了尖线。另外,被识别为围绕LC的准二维(2D)InGaN有源层发光的更宽的发射峰在较高能量下系统地出现。在单个Q盘上进行的时间分辨光致发光实验显示了在亚显微尺度下从2D InGaN活性层到LC的激子转移。激发功率依赖性研究和线性极化分析使我们能够鉴定出限制在单个Q盘中LC中的双激子复合物,其正结合能为13 meV,令人惊讶。我们没有通过增加激发功率密度和数百皮秒的快速激子辐射寿命来提高屏蔽效果,我们在几个单独的Q盘上进行了测量,这表明结构中没有内部电场可以解释观察到的正双激子结合能。

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