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The Electromagnetic Compatibility of Integrated Circuits-Past, Present, and Future

机译:过去,现在和将来集成电路的电磁兼容性

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摘要

Throughout the decades of continuous advances in semiconductor technology, from the discrete devices of the late 1950s to today's billon-transistor system-on-chip, there have always been concerns about the ability of components to operate safely in an increasingly disruptive electromagnetic environment. This paper provides a nonexhaustive review of the research work conducted in the field of electromagnetic compatibility (EMC) at the IC level over the past 40 years. It also brings together a collection of information and trends in IC technology, in order to build a tentative roadmap for the EMC of ICs until the year 2020, with a focus on measurement methods and modeling approaches.
机译:从1950年代后期的分立器件到当今的Billon晶体管片上系统,在半导体技术的数十年不断发展中,一直存在着对组件在不断破坏的电磁环境中安全运行的能力的担忧。本文对过去40年中在IC级别的电磁兼容性(EMC)领域进行的研究工作进行了详尽的介绍。它还汇集了IC技术的信息和趋势,以期为2020年之前的IC EMC建立暂定的路线图,重点是测量方法和建模方法。

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