Optical technique for the automatic detection and measurement of surface defects on thin metallic wires

摘要

In industrial applications of thin metallic wires it is important to characterize the surface defects of the wires. We present an optical technique for the automatic detection of surface defects on thin metallic wires (diameters, 50–2000 µm) that can be used in on-line systems for surface quality control. This technique is based on the intensity variations on the scattered cone generated when the wire is illuminated with a beam at oblique incidence. Our results are compared with those obtained by atomic-force microscopy and scanning-electron microscopy.