Radiation effects on CMOS R/2R ladder digital-to-analog converters

摘要

The behaviour of CMOS R/2R ladder D/A converters when they are irradiated simultaneously with gamma and neutron radiation is described. The converters suffer an increase of the offset error and a reduction of the linearity because of the malfunction of the internal CMOS switches and the appearance of leakage currents. The effective inputs become "1" whatever the actual input is. No evidence of neutron damage was found.