Coupled maximum entropy: Monte Carlo estimation of microwave, millimeter-wave and submillimeter-wave spectrum of velocity fluctuations in GaAs

摘要

The maximum entropy method is presented in this letter as a highly interesting procedure for the investigation of high frequency noise properties of bulk semiconductors and electron devices at microscopic level. A Monte Carlo simulation of the hot electron velocity fluctuations in bulk GaAs has been performed to illustrate the efficiency and usefulness of this procedure. Comparisons with the most popular techniques presently used in Monte Carlo simulations of noise have also been performed. (C) 1998 American Institute of Physics.