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Anisotropic surface properties of micro/nanostructured a-C:H:F thin films with self-assembly applications

机译:具有自组装应用的微米/纳米结构a-C:H:F薄膜的各向异性表面特性

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摘要

The singular properties of hydrogenated amorphous carbon (a-C:H) thin filmsdeposited by pulsed DC plasma enhanced chemical vapor deposition (PECVD), such as hardness and wear resistance, make it suitable as protective coating with low surface energy for self-assembly applications. In this paper, we designed fluorine-containing a-C:H (a-C:H:F) nanostructured surfaces and we characterized them for self-assembly applications. Sub-micron patterns were generated on silicon through laser lithography while contact angle measurements, nanotribometer, atomic force microscopy (AFM), and scanning electron microscopy (SEM) were used to characterize the surface. a-C:H:F properties on lithographied surfaces such as hydrophobicity and friction were improved with the proper relative quantity of CH4 and CHF3 during deposition, resulting in ultrahydrophobic samples and low friction coefficients. Furthermore, these properties were enhanced along the direction of the lithographypatterns (in-plane anisotropy). Finally, self-assembly properties were tested with silicananoparticles, which were successfully assembled in linear arrays following the generated patterns. Among the main applications, these surfaces could be suitable as particle filter selector and cell colony substrate.
机译:通过脉冲直流等离子体增强化学气相沉积(PECVD)沉积的氢化非晶碳(a-C:H)薄膜的奇异特性(例如硬度和耐磨性)使其适合作为具有低表面能的保护涂层用于自组装应用。在本文中,我们设计了含氟的a-C:H(a-C:H:F)纳米结构表面,并对其进行了表征,以用于自组装应用。通过激光光刻在硅上生成亚微米图案,同时使用接触角测量,纳米摩擦计,原子力显微镜(AFM)和扫描电子显微镜(SEM)表征表面。通过在沉积过程中使用适当的相对CH4和CHF3相对含量,可以改善光刻表面上的a-C:H:F特性,例如疏水性和摩擦性,从而导致超疏水性样品和低摩擦系数。此外,沿着光刻图案的方向(面内各向异性)增强了这些性质。最后,用硅纳米颗粒测试了自组装性能,该纳米颗粒按照生成的图案成功地以线性阵列组装。在主要应用中,这些表面可能适合用作颗粒过滤器选择器和细胞集落基质。

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