Combining ray-trace and diffraction analysis: A design example

摘要

An example is presented of using a combined ray trace and diffraction modeling code to simulate effects of objective-lens tilt in an optical data storage device. In some cases, neither ray-trace analysis nor diffraction analysis can give an adequate description of an optical system. The designer that is faced with the problem of analyzing such a system is forced to use a ray-trace program to determine aberrations in the exit pupil and then introduce aberration coefficients into a diffraction model that simulate the propagation. This approach was found rather awkward, especially if complicated aberrations are present. Our approach is to integrate a diffraction analysis and a ray-trace description of an optical path into one program. Our design is taken from a data storage application, where we must analyze the effects of objective-lens tilt.