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Simulated Space Vacuum Ultraviolet (VUV) Exposure Testing for Polymer Films

机译:聚合物薄膜的模拟空间真空紫外线(VUV)暴露测试

摘要

Vacuum ultraviolet (VUV) radiation of wavelengths between 115 and 200 nm produced by the sun in the space environment can cause degradation to polymer films producing changes in optical, mechanical, and chemical properties. These effects are particularly important for thin polymer films being considered for ultra-lightweight space structures, because, for most polymers, VUV radiation is absorbed in a thin surface layer. NASA Glenn Research Center has developed facilities and methods for long-term ground testing of polymer films to evaluate space environmental VUV radiation effects. VUV exposure can also be used as part of sequential simulated space environmental exposures to determine combined damaging effects. This paper will describe the effects of VUV on polymer films and the necessity for ground testing. Testing practices used at Glenn Research Center for VUV exposure testing will be described including characterization of the VUV radiation source used, calibration procedures traceable to the National Institute of Standards and Technology (NIST), and testing techniques for VUV exposure of polymer surfaces.
机译:太阳在太空环境中产生的波长在115至200 nm之间的真空紫外线(VUV)辐射会导致聚合物薄膜降解,从而导致光学,机械和化学性质发生变化。这些效果对于考虑用于超轻型空间结构的聚合物薄膜特别重要,因为对于大多数聚合物而言,VUV辐射被吸收在薄表面层中。美国宇航局格伦研究中心开发了用于聚合物薄膜长期地面测试的设备和方法,以评估太空环境中的VUV辐射效应。 VUV暴露也可以用作顺序模拟空间环境暴露的一部分,以确定组合的破坏效果。本文将介绍VUV对聚合物薄膜的影响以及进行地面测试的必要性。将介绍Glenn研究中心用于VUV暴露测试的测试方法,包括所用VUV辐射源的表征,可追溯至美国国家标准技术研究院(NIST)的校准程序以及聚合物表面VUV暴露的测试技术。

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