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High reliability sheathed, beryllia insulated, tungsten-rhenium alloy thermocouple assemblies; their fabrication and EMF stability

机译:高可靠性护套铍青铜绝缘钨-合金热电偶组件;它们的制造和EMF稳定性

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摘要

Tantalum sheathed, BeO insulated, W-3% Re/W-25% Re thermocouple assemblies were fabricated and their emf drift determined during 2059 hours of exposure at 2073 K in a gaseous helium environment. The sheathed thermocouple assemblies were constructed from aged thermoelements, specially heat-treated BeO insulators, and specially cleaned and etched tantalum sheaths. Their thermal emf drifts ranged from the equivalent of only -0.3 to -0.8 K drift per 1000 hours of exposure at 2073 K. No evidence of any gross chemical attack or degradation of the component materials was found. The emf drift and material behavior of some unsheathed, BeO insulated, W-3% Re/W-25% Re thermocouples at 2250 and 2400 K were also determined. Unsheathed thermocouples tested in an argon environment at 2250 K for 1100 hours and at 2400 K for 307 hours exhibited changes in thermal emf that typically ranged from the equivalent of a few degrees K to as much as +11 K. Post-test examinations of these thermocouples revealed some undesirable material degradation and interaction which included erosion of the BeO insulators and contamination of the thermoelements by tantalum from the tantalum blackbody enclosure in which the thermocouples were contained.
机译:制备了钽护套,BeO绝缘的W-3%Re / W-25%Re热电偶组件,并在气态氦气环境中于2073 K暴露2059小时后确定了它们的电动势漂移。铠装热电偶组件由老化的热电偶,经过特殊热处理的BeO绝缘体以及经过专门清洁和蚀刻的钽护套构成。它们在2073 K时每1000小时的热电动势漂移范围仅为-0.3至-0.8 K漂移。没有发现任何明显的化学侵蚀或成分材料降解的迹象。还确定了一些在2250和2400 K下没有护套,BeO绝缘的W-3%Re / W-25%Re热电偶的电动势漂移和材料性能。在氩气环境下在2250 K下进行1100小时和2400 K下进行307小时的无护套热电偶的热电动势变化通常在几度K到高达+11 K的范围内。测试后的检查热电偶显示出一些不良的材料降解和相互作用,其中包括BeO绝缘子的腐蚀以及钽从包含热电偶的钽黑体外壳中对热元素的污染。

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