首页> 外文OA文献 >Grain boundary mobility in anion doped MgO
【2h】

Grain boundary mobility in anion doped MgO

机译:阴离子掺杂MgO中的晶界迁移率

摘要

Certain anions OH(-), F(-) and Gl(-) are shown to enhance grain growth in MgO. The magnitude of their effect decreases in the order in which the anions are listed and depends on their location (solid-solution, second phase) in the MgO lattice. As most anions exhibit relatively high vapor pressures at sintering temperatures, they retard densification and invariably promote residual porosity. The role of anions on grain growth rates was studied in relation to their effect on pore mobility and pore removal; the atomic process controlling the actual rates was determined from observed kinetics in conjunction with the microstructural features. With respect to controlling mechanisms, the effects of all anions are not the same. OH(-) and F(-) control behavior through creation of a defect structure and a grain boundary liquid phase while Cl(-) promotes matter transport within pores by evaporation-condensation. Studies on an additional anion, S to the minus 2nd power gave results which were no different from undoped MgO, possibly because of evaporative losses during hot pressing. Hence, the effect of sulphur is negligible or undetermined.
机译:某些阴离子OH(-),F(-)和Gl(-)可以增强MgO中的晶粒生长。它们的作用强度按照列出阴离子的顺序降低,并且取决于它们在MgO晶格中的位置(固溶体,第二相)。由于大多数阴离子在烧结温度下均显示出较高的蒸气压,因此它们会延迟致密化并始终会促进残留孔隙率。研究了阴离子对晶粒生长速率的作用及其对孔隙迁移率和孔隙去除的影响。控制实际速率的原子过程是由观察到的动力学结合微观结构特征确定的。关于控制机制,所有阴离子的作用都不相同。 OH(-)和F(-)通过形成缺陷结构和晶界液相来控制行为,而Cl(-)通过蒸发冷凝促进物质在孔内的传输。对负2次方负离子S的研究得出的结果与未掺杂的MgO相同,可能是由于热压过程中的蒸发损失所致。因此,硫的影响可以忽略不计或不确定。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号