Microwave Nondestructive Evaluation of Dielectric Materials with a Metamaterial Lens

摘要

A novel microwave Nondestructive Evaluation (NDE) sensor was developed in an attempt to increase the sensitivity of the microwave NDE method for detection of defects small relative to a wavelength. The sensor was designed on the basis of a negative index material (NIM) lens. Characterization of the lens was performed to determine its resonant frequency, index of refraction, focus spot size, and optimal focusing length (for proper sample location). A sub-wavelength spot size (3 dB) of 0.48 lambda was obtained. The proof of concept for the sensor was achieved when a fiberglass sample with a 3 mm diameter through hole (perpendicular to the propagation direction of the wave) was tested. The hole was successfully detected with an 8.2 cm wavelength electromagnetic wave. This method is able to detect a defect that is 0.037 lambda. This method has certain advantages over other far field and near field microwave NDE methods currently in use.