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>Pressure Decay Testing Methodology for Quantifying Leak Rates of Full-Scale Docking System Seals
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Pressure Decay Testing Methodology for Quantifying Leak Rates of Full-Scale Docking System Seals
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机译:用于定量对接系统密封件泄漏率的压力衰减测试方法
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NASA is developing a new docking system to support future space exploration missions to low-Earth orbit and the Moon. This system, called the Low Impact Docking System, is a mechanism designed to connect the Orion Crew Exploration Vehicle to the International Space Station, the lunar lander (Altair), and other future Constellation Project vehicles. NASA Glenn Research Center is playing a key role in developing the main interface seal for this docking system. This seal will be relatively large with an outside diameter in the range of 54 to 58 in. (137 to 147 cm). As part of this effort, a new test apparatus has been designed, fabricated, and installed to measure leak rates of candidate full-scale seals under simulated thermal, vacuum, and engagement conditions. Using this test apparatus, a pressure decay testing and data processing methodology has been developed to quantify full-scale seal leak rates. Tests performed on untreated 54 in. diameter seals at room temperature in a fully compressed state resulted in leak rates lower than the requirement of less than 0.0025 lbm, air per day (0.0011 kg/day).
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机译:美国宇航局正在开发一种新的对接系统,以支持未来的低空轨道和月球太空探索任务。该系统称为“低影响对接系统”,是一种用于将“猎户座”乘员探索车与国际空间站,月球着陆器(Altair)以及其他未来星座项目飞行器连接的机制。美国宇航局格伦研究中心在为该扩展坞系统开发主界面密封件方面发挥着关键作用。该密封件将相对较大,外径在54到58英寸(137到147厘米)的范围内。作为这项工作的一部分,已经设计,制造和安装了一种新的测试设备,以在模拟的热,真空和接合条件下测量候选全尺寸密封的泄漏率。使用该测试设备,已开发出压力衰减测试和数据处理方法来量化全尺寸密封泄漏率。在室温下以完全压缩状态在未经处理的54英寸直径的密封件上进行的测试导致泄漏率低于每天少于0.0025 lbm的空气(0.0011 kg /天)的要求。
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