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Sensitivity of VIIRS Polarization Measurements

机译:VIIRS偏振测量的灵敏度

摘要

The design of an optical system typically involves a sensitivity analysis where the various lens parameters, such as lens spacing and curvatures, to name two parameters, are (slightly) varied to see what, if any, effect this has on the performance and to establish manufacturing tolerances. A sinular analysis was performed for the VIIRS instruments polarization measurements to see how real world departures from perfectly linearly polarized light entering VIIRS effects the polarization measurement. The methodology and a few of the results of this polarization sensitivity analysis are presented and applied to the construction of a single polarizer which will cover the VIIRS VIS/NIR spectral range. Keywords: VIIRS, polarization, ray, trace; polarizers, Bolder Vision, MOXTEK
机译:光学系统的设计通常涉及灵敏度分析,其中(稍微)改变了各种透镜参数(例如透镜间距和曲率)(仅举两个参数),以查看其对性能的影响(如果有)并确定制造公差。对VIIRS仪器的偏振测量进行了正弦分析,以了解现实世界中进入VIIRS的完全线性偏振光如何偏离偏振测量。介绍了这种偏振灵敏度分析的方法和一些结果,并将其应用于覆盖VIIRS VIS / NIR光谱范围的单个偏振器的构造。关键词:VIIRS偏振射线痕量偏光镜,Bolder Vision,MOXTEK

著录项

  • 作者

    Waluschka Eugene;

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  • 年度 2010
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