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SPAD Figures of Merit for Photon-Counting, Photon-Timing, and Imaging Applications: A Review

机译:SPAD在光子计数,光子定时和成像应用方面的优异表现:综述

摘要

Single-photon avalanche diodes (SPADs) emerged as the most suitable photodetectors for both single-photon counting and photon-timing applications. Different complementary metal-oxide-semiconductor (CMOS) devices have been reported in the literature, with quite different performance and some excelling in just few of them, but often at different operating conditions. In order to provide proper criteria for performance assessment, we present some figures of merit (FoMs) able to summarize the typical SPAD performance (i.e., photon detection efficiency, dark counting rate, afterpulsing probability, hold-off time, and timing jitter) and to identify a proper metric for SPAD comparisons, when used either as single-pixel detectors or in imaging arrays. The ultimate goal is not to define a ranking list of best-in-class detectors, but to quantitatively help the end-user to state the overall performance of different SPADs in either photon-counting, timing, or imaging applications. We review many CMOS SPADs from different research groups and companies, we compute the proposed FoMs for all them and, eventually, we provide an insight on present CMOS SPAD technologies and future trends.
机译:单光子雪崩二极管(SPAD)成为最适合单光子计数和光子定时应用的光电探测器。文献中已经报道了不同的​​互补金属氧化物半导体(CMOS)器件,它们具有相当不同的性能,并且其中只有极少数具有卓越的性能,但通常在不同的工作条件下。为了提供适当的性能评估标准,我们提出了一些品质因数(FoM),它们能够总结出典型的SPAD性能(即光子检测效率,暗计数率,后脉冲概率,延迟时间和时序抖动),以及当用作单像素检测器或用于成像阵列时,可以确定用于SPAD比较的适当指标。最终目标不是定义最佳检测器的排名列表,而是定量地帮助最终用户陈述光子计数,定时或成像应用中不同SPAD的整体性能。我们审查了来自不同研究组和公司的许多CMOS SPAD,我们为所有这些计算了FoM,最终,我们对当前的CMOS SPAD技术和未来趋势提供了见解。

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