Subpixel Edge Localization (EL) techniques are often affected by an error that exhibits a systematic characterWhen this happens their performance can be improvedthrough compensation of the systematic portion of thelocalization error In this paper we propose and analyzea method for estimating the EL characteristic of subpixel EL techniques through statistical analysis of appropriate test images The impact of the compensation method on the accuracy of a camera calibration procedure has been proven to be quite signicant, which can be crucial especially in applications of low-cost photogrammetry and 3D reconstruction from multiple views.
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