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Doping Dependent Subthreshold Swing Modelling of Quadruple Gate MOSFETs

机译:四栅极MOSFET的掺杂相关亚阈值摆幅建模

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摘要

MOSFET scaling has undergone a drastic change in the size and packing density in the recent years and new methods of improvising the performance of the device being introduced every year. Many ingenious techniques have been used to model the device and its properties. There are many to model the same device parameter. So it is upto the designer's requirement to choose the method that is suitable for him. Some methods give more accuracy but take very large computational time where as some may provide results with less accuracy but provide results faster. Here in this thesis we have brought a balance between the two, i.e. the methodology used here is simple but very ecient in providing results to very satisfactory levels. A potential function has been developed for a quadruple gate MOSFET by introducing the concept of eective number of gates (ENGs). In this ENGs concept the quadruple gate MOSFET is broken into 2 double gate MOSFETs and so the need to solve large 3-D equations nullies. The 2-D potential function in the channel is assumed to be parabolic in nature and the 2-D Poission's equation has been solved to obtain the channel potential function. After introducing the concept of ENGs the 3-D structure has been successfully modelled into a 2-D structure. This is the main advantage of this technique. Then the subthreshold swing parameter is obtained by the concept of eective conduction path. Finally after the device has been modelled the eect of variation of device parameters on subthreshold swing is analysed. The device parameters that have been considered for variation are device channel length, oxide thickness, channel thickness, drain to source voltage, channel doping. ATLASTM has been used for obtaining the simulation results and validated against the modelling results obtained with the help of MATLABTM. Both the results have been plotted together and their level of matching in observed and analysed.
机译:近年来,MOSFET的尺寸和封装密度发生了巨大的变化,并且每年都会出现新的改善器件性能的方法。许多巧妙的技术已被用来对设备及其特性建模。有很多模型可以模拟相同的设备参数。因此,由设计师决定是否选择适合他的方法。一些方法提供了更高的准确性,但是占用了很大的计算时间,其中有些方法可能会以较低的准确性提供结果,但提供更快的结果。在本文中,我们在两者之间取得了平衡,即,此处使用的方法很简单,但是在提供令人满意的结果方面非常有效。通过引入有效栅极数(ENGs)的概念,已经为四栅极MOSFET开发了势函数。在这个ENGs概念中,四栅极MOSFET分为2个双栅极MOSFET,因此需要解决大型3-D方程无效的问题。假定通道中的2-D势函数本质上是抛物线形,并且已经求解了2-Poission方程以获得通道势函数。在介绍了ENG的概念之后,已将3-D结构成功地建模为2-D结构。这是该技术的主要优点。然后通过有效传导路径的概念获得亚阈值摆动参数。最终,在对设备建模之后,分析了亚阈值摆幅上设备参数变化的影响。已经考虑变化的器件参数是器件沟道长度,氧化物厚度,沟道厚度,漏极至源极电压,沟道掺杂。 ATLASTM已用于获取仿真结果,并针对借助MATLABTM获得的建模结果进行了验证。将两个结果绘制在一起,并观察和分析它们的匹配程度。

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    Gourav Tuhinansu;

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  • 年度 2015
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