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Electron diffraction and high-resolution transmission electron microscopy of the high temperature crystal structures of GexSb2Te3+x (x=1,2,3) phase change material

机译：GexSb2Te3 + x（x = 1,2,3）相变材料的高温晶体结构的电子衍射和高分辨率透射电镜

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Kooi B.J.; de Hosson J.T.M.;
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年度 2002
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1. Local structure analysis of Ge-Sb-Te phase change materials using high-resolution electron microscopy and nanobeam diffraction [J] . Muneyuki Naito, Manabu Ishimaru, Yoshihiko Hirotsu, Journal of Applied Physics . 2004,第12期

机译：Ge-Sb-Te相变材料的局部结构的高分辨率电子显微镜和纳米束衍射分析
2. In Situ Electron Diffraction Tomography Using a Liquid-Electrochemical Transmission Electron Microscopy Cell for Crystal Structure Determination of Cathode Materials for Li-Ion batteries [J] . Karakulina Olesia M., Demortiere Arnaud, Dachraoui Walid, Nano letters . 2018,第10期

机译：使用液体电化学透射电子显微镜电池的原位电子衍射断层扫描，用于晶体结构的锂离子电池的阴极材料
3. Microstructure of Si Crystals Subjected to Irradiation with High-Energy H+ Ions and Heat Treatment by High-Resolution Three-Crystal X-Ray Diffraction and Transmission Electron Microscopy [J] . Asadchikov V. E., Dyachkova I. G., Zolotov D. A., Physics of the solid state . 2019,第10期

机译：用高能H +离子照射的Si晶体的微观结构和高分辨率三晶X射线衍射和透射电子显微镜的热处理
4. STRUCTURES OF ZEOLITES ANDMESOPOROUS CRYSTALS DETERMINED BYELECTRON DIFFRACTION AND HIGH-RESOLUTION ELECTRON MICROSCOPY [C] . Osamu Terasaki NATO Advanced Study Institute on Electron Crystallography: Novel Approaches for Structure Determination of Nanosized Materials . 2006

机译：通过电子衍射和高分辨率电子显微镜测定沸石和晶体晶体的结构
5. Insights from scanning transmission electron microscopy and x-ray diffraction into the structure and composition of non-crystalline thin solid films [D] . Mitchson, Gavin Andersen. 2016

机译：从扫描透射电子显微镜和X射线衍射到非晶薄固体膜的结构和组合物中的见解
6. Structure refinement of the δ1p phase in the Fe–Zn system by single-crystal X-ray diffraction combined with scanning transmission electron microscopy [O] . Norihiko L. Okamoto, Katsushi Tanaka, Akira Yasuhara, -1

机译：单晶X射线衍射结合扫描透射电镜对Fe-Zn体系中δ1p相的结构细化
7. Electron diffraction and high-resolution transmission electron microscopy of the high temperature crystal structures of GexSb2Te3+x (x=1,2,3) phase change material [O] . Kooi, B.J., de Hosson, J.T.M. 2002

机译：GexSb2Te3 + x（x = 1,2,3）相变材料的高温晶体结构的电子衍射和高分辨率透射电镜

Electron diffraction and high-resolution transmission electron microscopy of the high temperature crystal structures of GexSb2Te3+x (x=1,2,3) phase change material

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