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Positron annihilation and transmission electron microscopy study of the evolution of microstructure in cold-rolled and nitrided FeNiTi foils

机译:正电子an没和透射电镜研究冷轧和氮化FeNiTi箔组织的演变

摘要

Positron beam analysis (PBA) and transmission electron microscopy (TEM) were applied to study structural transformations in cold-rolled Fe0.94Ni0.04Ti0.02 foils, which were subjected to different thermal treatments in an atmosphere of a gas mixture of NH3 + H2 (nitriding). Positrons proved to be sensitive probes for the microstructure evolution and formation of nitride precipitates. The nitriding of the samples in the α-region (αN) of the Lehrer diagram for the Fe–N system produced a large decrease of the central part of the Doppler broadened annihilation γ-peak (S-parameter) and an increase of the contribution to the wings of the peak (W-parameter). The effect, ascribed to replacing of vacancy type positron traps by nitride-related traps, was much more pronounced for the α-nitrided samples than for samples annealed in vacuum at the same temperature. A reduction of the αN samples by annealing in H2 atmosphere brings the S-parameter back to a higher value. Further nitriding of αN samples in the γ'-region (αN + γ'N) of the Lehrer diagram increases S and lowers the W-parameter compared with the αN samples. The changes in S- and W-parameters are interpreted on the basis of the evolution of microstructure of the films during the processing.
机译:正电子束分析(PBA)和透射电子显微镜(TEM)用于研究冷轧Fe0.94Ni0.04Ti0.02箔的结构转变,这些箔在NH3 + H2混合气体的气氛中经受了不同的热处理(氮化)。正电子被证明是氮化物沉淀的微观结构演变和形成的敏感探针。 Fe–N系统的Lehrer图的α区域(αN)中的样品渗氮使多普勒加宽的ation没γ峰(S参数)的中心部分大大减小,并且贡献增加了到峰的翅膀(W参数)。与氮化在同一温度下真空退火的样品相比,α氮化样品对空位型正电子阱被氮化物相关阱代替的影响更为明显。通过在H2气氛中退火而减少的αN样品可使S参数恢复到较高的值。与αN样品相比,在Lehrer图的γ'区域(αN+γ'N)中进一步对αN样品进行氮化,会增加S值并降低W参数。 S和W参数的变化是根据处理过程中薄膜微结构的演变来解释的。

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