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Effect of the fabrication technique on the thermoelectric performance of Mg-based compounds—A case study of n-Type Mg2Ge

机译:制备工艺对镁基化合物热电性能的影响-以n型Mg2Ge为例

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摘要

High performance, low cost, and low toxicity have been the main characteristics associated with magnesium-based thermoelectric materials. Nevertheless, the high volatility of magnesium creates challenges in the synthesis of these materials. In this work, n-type Mg2Ge is synthesized using a solid-state technique, fully characterized, and compared with Mg2Ge fabricated through different processes. We have found that Bi is an ineffective dopant in Mg2Ge and precipitates into Mg2Bi3. Regardless of the technique used, the loss of Mg by evaporation and formation of precipitates in Bi-doped samples resulted in a low charge carrier concentration and, consequently, a low power factor. The precipitates significantly reduced the lattice thermal conductivity, however, leading to a figure-of-merit, zT, of 0.4 at 725 K, improving the previously reported figure-of-merit, zT, of 0.2 for Sb-doped Mg2Ge. This work highlights the impact of the fabrication technique on the thermoelectric performance of Mg-based compounds.
机译:高性能,低成本和低毒性已成为镁基热电材料的主要特征。然而,镁的高挥发性在这些材料的合成中提出了挑战。在这项工作中,使用固态技术合成了n型Mg2Ge,对其进行了充分表征,并与通过不同工艺制造的Mg2Ge进行了比较。我们已经发现,Bi在Mg2Ge中是无效的掺杂剂,并沉淀到Mg2Bi3中。不管使用哪种技术,在Bi掺杂样品中蒸发和形成沉淀物都会导致Mg损失,从而导致载流子浓度低,因此功率因数也低。沉淀物显着降低了晶格热导率,但是,导致在725 K时的品质因数zT为0.4,从而改善了先前报道的掺Sb的Mg2Ge的品质因数zT为0.2。这项工作突出了制造技术对基于Mg的化合物的热电性能的影响。

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